Dalfors, J., Lundström, T., Holtz, P. O., Radamson, H. H., Monemar, B., Wallin, J., Landgren, G. (1996) The electronic structure of InGaAs/InP quantum wells measured by Fourier transform photoluminescence excitation spectroscopy. Journal of Applied Physics, 80 (12). 6855-6860 doi:10.1063/1.363752
Reference Type | Journal (article/letter/editorial) | ||
---|---|---|---|
Title | The electronic structure of InGaAs/InP quantum wells measured by Fourier transform photoluminescence excitation spectroscopy | ||
Journal | Journal of Applied Physics | ||
Authors | Dalfors, J. | Author | |
Lundström, T. | Author | ||
Holtz, P. O. | Author | ||
Radamson, H. H. | Author | ||
Monemar, B. | Author | ||
Wallin, J. | Author | ||
Landgren, G. | Author | ||
Year | 1996 (December 15) | Volume | 80 |
Issue | 12 | ||
Publisher | AIP Publishing | ||
DOI | doi:10.1063/1.363752Search in ResearchGate | ||
Generate Citation Formats | |||
Mindat Ref. ID | 5081856 | Long-form Identifier | mindat:1:5:5081856:9 |
GUID | 0 | ||
Full Reference | Dalfors, J., Lundström, T., Holtz, P. O., Radamson, H. H., Monemar, B., Wallin, J., Landgren, G. (1996) The electronic structure of InGaAs/InP quantum wells measured by Fourier transform photoluminescence excitation spectroscopy. Journal of Applied Physics, 80 (12). 6855-6860 doi:10.1063/1.363752 | ||
Plain Text | Dalfors, J., Lundström, T., Holtz, P. O., Radamson, H. H., Monemar, B., Wallin, J., Landgren, G. (1996) The electronic structure of InGaAs/InP quantum wells measured by Fourier transform photoluminescence excitation spectroscopy. Journal of Applied Physics, 80 (12). 6855-6860 doi:10.1063/1.363752 | ||
In | (1996, December) Journal of Applied Physics Vol. 80 (12) AIP Publishing |
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