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Jark, Werner, Di Fonzo, Silvia, Lagomarsino, Stefano, Cedola, Alessia, di Fabrizio, Enzo, Bram, Andreas, Riekel, Christian (1996) Properties of a submicrometer x‐ray beam at the exit of a waveguide. Journal of Applied Physics, 80 (9). 4831-4836 doi:10.1063/1.363524

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Reference TypeJournal (article/letter/editorial)
TitleProperties of a submicrometer x‐ray beam at the exit of a waveguide
JournalJournal of Applied Physics
AuthorsJark, WernerAuthor
Di Fonzo, SilviaAuthor
Lagomarsino, StefanoAuthor
Cedola, AlessiaAuthor
di Fabrizio, EnzoAuthor
Bram, AndreasAuthor
Riekel, ChristianAuthor
Year1996 (November)Volume80
Issue9
PublisherAIP Publishing
DOIdoi:10.1063/1.363524Search in ResearchGate
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Mindat Ref. ID5083485Long-form Identifiermindat:1:5:5083485:9
GUID0
Full ReferenceJark, Werner, Di Fonzo, Silvia, Lagomarsino, Stefano, Cedola, Alessia, di Fabrizio, Enzo, Bram, Andreas, Riekel, Christian (1996) Properties of a submicrometer x‐ray beam at the exit of a waveguide. Journal of Applied Physics, 80 (9). 4831-4836 doi:10.1063/1.363524
Plain TextJark, Werner, Di Fonzo, Silvia, Lagomarsino, Stefano, Cedola, Alessia, di Fabrizio, Enzo, Bram, Andreas, Riekel, Christian (1996) Properties of a submicrometer x‐ray beam at the exit of a waveguide. Journal of Applied Physics, 80 (9). 4831-4836 doi:10.1063/1.363524
In(1996, November) Journal of Applied Physics Vol. 80 (9) AIP Publishing

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Lagomarsino, S., Jark, W., Di Fonzo, S., Cedola, A., Mueller, B., Engström, P., Riekel, C. (1996) Submicrometer x-ray beam production by a thin film waveguide. Journal of Applied Physics, 79 (8). 4471pp. doi:10.1063/1.361761
Lagomarsino, S., Jark, W., Di Fonzo, S., Cedola, A., Riekel, C. (1996) A hard X-ray waveguide for submicrometer coherent beam production. Acta Crystallographica Section A Foundations of Crystallography, 52. doi:10.1107/s0108767396098546
Di Fonzo, S., Jark, W., Soullié, G., Cedola, A., Lagomarsino, S., Cloetens, P., Riekel, C. (1998) Submicrometre resolution phase-contrast radiography with the beam from an X-ray waveguide. Journal of Synchrotron Radiation, 5 (3). 376-378 doi:10.1107/s0909049597019250
Cedola, A., Lagomarsino, S., Di Fonzo, S., Jark, W., Riekel, C., Deschamps, P. (1998) Submicrometre Beams from a Hard X-ray Waveguide at a Third-Generation Synchrotron Radiation Source. Journal of Synchrotron Radiation, 5 (1). 17-22 doi:10.1107/s0909049597011175
Lagomarsino, S., Cedola, A., Cloetens, P., Di Fonzo, S., Jark, W., Soullié, G., Riekel, C. (1997) Phase contrast hard x-ray microscopy with submicron resolution. Applied Physics Letters, 71 (18). 2557-2559 doi:10.1063/1.119324
Pełka, Jerzy B., Cedola, Alessia, Lagomarsino, Stefano, di Fonzo, Silvia, Jark, Werner, Soullié, Gerard (1999) Application of resonance-enhanced X-ray standing waves to the study of layered structures by grazing-incidence X-ray reflectometry and secondary radiation. Journal of Alloys and Compounds, 286. 313-321 doi:10.1016/s0925-8388(98)01027-5
Lagomarsino, S., Cedola, A., Di Fonzo, S., Jark, W., Mocella, V., Pelka, J. B., Riekel, C. (2002) Advances in Microdiffraction with X-Ray Waveguide. Crystal Research and Technology, 37 (7) 758 doi:10.1002/1521-4079(200207)37:7<758::aid-crat758>3.0.co;2-v
Jark, W., Cedola, A., Di Fonzo, S., Fiordelisi, M., Lagomarsino, S., Kovalenko, N. V., Chernov, V. A. (2001) High gain beam compression in new-generation thin-film x-ray waveguides. Applied Physics Letters, 78 (9). 1192-1194 doi:10.1063/1.1350956
Giannini, C, Caro, L De, Lagomarsino, S, Cedola, A, Fonzo, S Di, Jark, W (2001) X-ray waveguide as a new tool for 100 nm spatially resolved x-ray strain analysis. Journal of Physics D: Applied Physics, 34. doi:10.1088/0022-3727/34/10a/309
De Caro, Liberato, Giannini, Cinzia, Cedola, Alessia, Pelliccia, Daniele, Lagomarsino, Stefano, Jark, Werner (2007) Phase retrieval in x-ray coherent Fresnel projection-geometry diffraction. Applied Physics Letters, 90 (4). 41105pp. doi:10.1063/1.2431457
Cedola, A, Fonzo, S Di, Jark, W, Lagomarsino, S, Soullié, G (1999) Sub-micrometre coherent beams from x-ray waveguides: principles and applications. Journal of Physics D: Applied Physics, 32. doi:10.1088/0022-3727/32/10a/335
 
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