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(1999, January) Journal of Applied Physics Vol. 85 (1) AIP Publishing

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Reference TypeJournal (issue)
JournalJournal of Applied Physics
Year1999 (January)Volume85
Issue1   >
PublisherAIP Publishing
Mindat Ref. ID5094114Long-form Identifiermindat:1:5:5094114:0
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Full Reference(1999, January) Journal of Applied Physics Vol. 85 (1) AIP Publishing
Plain Text(1999, January) Journal of Applied Physics Vol. 85 (1) AIP Publishing
In(1999) Journal of Applied Physics Vol. 85. AIP Publishing

Contains

Deåk, L., Bayreuther, G., Bottyån, L., Gerdau, E., Korecki, J., Kornilov, E. I., Lauter, H. J., Leupold, O., Nagy, D. L., Petrenko, A. V., Pasyuk-Lauter, V. V., Reuther, H., Richter, E., Röhloberger, R., Szilågyi, E. (1999) Pure nuclear Bragg reflection of a periodic 56Fe/57Fe multilayer. Journal of Applied Physics, 85 (1). 1-7 doi:10.1063/1.369470
Nemirovsky, Y. (1999) Statistical modeling of charge collection in semiconductor gamma-ray spectrometers. Journal of Applied Physics, 85 (1). 8-15 doi:10.1063/1.369425
Lee, Sung Ho (1999) Coupling between the ionic cyclotron motion and the circular ionic drift motion in a cylindrical ion cyclotron resonance cell. Journal of Applied Physics, 85 (1). 16-22 doi:10.1063/1.369465
Kinsler, P., Harrison, P., Kelsall, R. W. (1999) Intersubband terahertz lasers using four-level asymmetric quantum wells. Journal of Applied Physics, 85 (1). 23-28 doi:10.1063/1.369435
Tsuda, M., Soga, K., Inoue, H., Inoue, S., Makishima, A. (1999) Upconversion mechanism in Er3+-doped fluorozirconate glasses under 800 nm excitation. Journal of Applied Physics, 85 (1). 29-37 doi:10.1063/1.369445
Cui, Yiping, Swedek, Bogdan, Cheng, Ning, Zieba, Jaroslaw, Prasad, Paras N. (1999) Dynamics of photorefractive grating erasure in polymeric composites. Journal of Applied Physics, 85 (1). 38-43 doi:10.1063/1.369395
Wintle, H. J. (1999) Kramers–Kronig analysis of polymer acoustic data. Journal of Applied Physics, 85 (1). 44-48 doi:10.1063/1.369406
Tatarova, E., Dias, F. M., Ferreira, C. M., Ricard, A. (1999) On the axial structure of a nitrogen surface wave sustained discharge: Theory and experiment. Journal of Applied Physics, 85 (1). 49-62 doi:10.1063/1.369480
Kelly, K. L., Scharer, J. E., Ding, G., Bettenhausen, M., Kuo, S. P. (1999) Microwave reflections from a vacuum ultraviolet laser produced plasma sheet. Journal of Applied Physics, 85 (1). 63-68 doi:10.1063/1.369392
Sobral, H., Schinca, D., Gallardo, M., Duchowicz, R. (1999) Time dependent study of a multi-ionic xenon plasma. Journal of Applied Physics, 85 (1). 69-73 doi:10.1063/1.369422
Kota, Gowri P., Coburn, J. W., Graves, David B. (1999) Heteronuclear and homonuclear surface abstraction reactions of Cl, Br, and F. Journal of Applied Physics, 85 (1). 74-86 doi:10.1063/1.369423
Augustyniak, Edward, Chew, Kok Heng, Shohet, J. Leon, Woods, R. Claude (1999) Atomic absorption spectroscopic measurements of silicon atom concentrations in electron cyclotron resonance silicon oxide deposition plasmas. Journal of Applied Physics, 85 (1). 87-93 doi:10.1063/1.369424
Zhang, Miao, Lin, Chenglu, Duo, Xinzhong, Lin, Zixin, Zhou, Zuyao (1999) Comparison of Cu gettering to H+ and He+ implantation-induced cavities in separation-by-implantation-of-oxygen wafers. Journal of Applied Physics, 85 (1). 94-98 doi:10.1063/1.369426
Campos, F. J., Mestres, N., Pascual, J., Morvan, E., Godignon, P., MillĂĄn, J. (1999) Confocal micro-Raman characterization of lattice damage in high energy aluminum implanted 6H-SiC. Journal of Applied Physics, 85 (1). 99-104 doi:10.1063/1.369427
Gong, M., Fung, S., Beling, C. D., Brauer, G., Wirth, H., Skorupa, W. (1999) Gallium implantation induced deep levels in n-type 6H–SIC. Journal of Applied Physics, 85 (1). 105-107 doi:10.1063/1.369428
Schwarz, K. W. (1999) Simulation of dislocations on the mesoscopic scale. I. Methods and examples. Journal of Applied Physics, 85 (1). 108-119 doi:10.1063/1.369429
Schwarz, K. W. (1999) Simulation of dislocations on the mesoscopic scale. II. Application to strained-layer relaxation. Journal of Applied Physics, 85 (1). 120-129 doi:10.1063/1.369430
Somoza, Alberto, Romero, Ricardo, Mañosa, Lluı́s, Planes, Antoni (1999) Aging behavior in Cu–Al–Be shape memory alloy. Journal of Applied Physics, 85 (1). 130-133 doi:10.1063/1.369431
Plumereau, G., Aranda, P., Ailloud, P., Berger, P., Boutard, D., Ladieu, F. (1999) Noise-induced local heatings in beam irradiation. Journal of Applied Physics, 85 (1). 134-147 doi:10.1063/1.369432
Chen, G. S., Humphreys, C. J. (1999) Study of sample thickness dependence in electron-beam irradiation of self-developing inorganic materials. Journal of Applied Physics, 85 (1). 148-152 doi:10.1063/1.369461
Bennett, Ted D., Krajnovich, Douglas J., Li, Lei (1999) Thermophysical modeling of bump formation during CO2 laser texturing of silicate glasses. Journal of Applied Physics, 85 (1). 153-159 doi:10.1063/1.369462
Mattila, T., Zunger, Alex (1999) Predicted bond length variation in wurtzite and zinc-blende InGaN and AlGaN alloys. Journal of Applied Physics, 85 (1). 160-167 doi:10.1063/1.369463
Valakh, M. Ya., Yukhimchuk, V. A., Bratus’, V. Ya., Konchits, A. A., Hemment, P. L. F., Komoda, T. (1999) Optical and electron paramagnetic resonance study of light-emitting Si+ ion implanted silicon dioxide layers. Journal of Applied Physics, 85 (1). 168-173 doi:10.1063/1.369464
Huang, M. B., Mitchell, I. V. (1999) Trapping of Si interstitials in boron doping background: Boron clustering and the “+1” model. Journal of Applied Physics, 85 (1). 174-181 doi:10.1063/1.369466
Romanov, A. E., Pompe, W., Mathis, S., Beltz, G. E., Speck, J. S. (1999) Threading dislocation reduction in strained layers. Journal of Applied Physics, 85 (1). 182-192 doi:10.1063/1.369467
Szelagowski, H., Arvanitidis, I., Seetharaman, S. (1999) Effective thermal conductivity of porous strontium oxide and strontium carbonate samples. Journal of Applied Physics, 85 (1). 193-198 doi:10.1063/1.369468
Halsall, M. P., Dunbar, A. D. F., Bangert, U. (1999) Electron diffraction and Raman studies of the effect of substrate misorientation on ordering in the AlGaInP system. Journal of Applied Physics, 85 (1). 199-202 doi:10.1063/1.369469
Imai, Hiroaki, Tominaga, Atsushi, Hirashima, Hiroshi, Toki, Motoyuki, Asakuma, Naoko (1999) Ultraviolet-reduced reduction and crystallization of indium oxide films. Journal of Applied Physics, 85 (1). 203-207 doi:10.1063/1.369471
Kim, T.-J., Krishnamoothy, V., Puga-Lambers, M., Holloway, P. H. (1999) Solid phase epitaxial regrowth of n-GaAs with Ti–Ge–Ni metallization for ohmic contacts. Journal of Applied Physics, 85 (1). 208-212 doi:10.1063/1.369472
Terry, Jeff, Linford, Matthew R., Wigren, Christer, Cao, Renyu, Pianetta, Piero, Chidsey, Christopher E. D. (1999) Alkyl-terminated Si(111) surfaces: A high-resolution, core level photoelectron spectroscopy study. Journal of Applied Physics, 85 (1). 213-221 doi:10.1063/1.369473
Sounilhac, S., Barthel, E., Creuzet, F. (1999) Simultaneous atomic force microscopy measurement of long range forces and adhesion energy between tungsten and oxide surfaces under ambient atmosphere and ultrahigh vacuum. Journal of Applied Physics, 85 (1). 222-227 doi:10.1063/1.369474
Shern, C. S., Tsay, J. S., Chen, S. L., Wu, Y. E. (1999) Effect of annealing of Ag ultrathin films on Co/Pt(111) surface. Journal of Applied Physics, 85 (1). 228-232 doi:10.1063/1.369475
Suh, K. Y., Lee, Hong H., Yoon, E. (1999) Two-step kinetics of As/P exchange reaction. Journal of Applied Physics, 85 (1). 233-236 doi:10.1063/1.369433
Huang, S., Soo, Y. L., Ming, Z. H., Kao, Y. H., Na, M. H., Chang, H. C., Lee, E. H., Luo, H., Peck, J., Mountziaris, T. J. (1999) Studies of ZnSe-based semiconductor thin films using grazing incidence x-ray scattering and diffraction. Journal of Applied Physics, 85 (1). 237-243 doi:10.1063/1.369434
Kanashima, Takeshi, Okuyama, Masanori (1999) Molecular orbital analysis of reaction processes of fluorine with H-terminated silicon (111) and (100) surfaces. Journal of Applied Physics, 85 (1). 244-248 doi:10.1063/1.369436
WĂŒllner, D., Chahoud, M., Schrimpf, T., Bönsch, P., Wehmann, H.-H., Schlachetzki, A. (1999) Diffusion during metalorganic vapor-phase epitaxy on V-groove patterned substrates. Journal of Applied Physics, 85 (1). 249-255 doi:10.1063/1.369437
Baraldi, A., Ghezzi, C., Parisini, A., Magnanini, R., Tarricone, L., Franchi, S. (1999) Occupancy level of the DX center in Te-doped AlxGa1−xSb. Journal of Applied Physics, 85 (1). 256-263 doi:10.1063/1.369438
Lu, Shih-Yuan (1999) Effective conductivities of rectangular arrays of aligned spheroids. Journal of Applied Physics, 85 (1). 264-269 doi:10.1063/1.369439
Steinberg, Michal, Peskin, Uri (1999) A theoretical investigation of field induced switching in a disordered electron wave coupler. Journal of Applied Physics, 85 (1). 270-275 doi:10.1063/1.369440
Knauth, S., Lenzner, J., Herrnberger, H., Grill, W., Böhm, A., Gröger, A., Heil, J., Primke, M., Wyder, P. (1999) Observation of ballistic carrier propagation in Bi and W by scanning electron microscopy. Journal of Applied Physics, 85 (1). 276-279 doi:10.1063/1.369441
Bai, S. J., Srinivasan, K. R., Tan, Loon-Seng, Spry, R. J., Price, G. E. (1999) Enhanced electrical properties of rigid-rod polymer incorporated with electroactive triarylamino moieties. Journal of Applied Physics, 85 (1). 280-286 doi:10.1063/1.369442
Hwang, Cheol Seong, Lee, Byoung Taek, Kang, Chang Seok, Lee, Ki Hoon, Cho, Hag-Ju, Hideki, Horii, Kim, Wan Don, Lee, Sang In, Lee, Moon Yong (1999) Depletion layer thickness and Schottky type carrier injection at the interface between Pt electrodes and (Ba, Sr)TiO3 thin films. Journal of Applied Physics, 85 (1). 287-295 doi:10.1063/1.369443
Main, C., Zollondz, J.-H., Reynolds, S., Gao, W., BrĂŒggemann, R., Rose, M. J. (1999) Investigation of collection efficiencies much larger than unity in a-Si:H p-i-n structures. Journal of Applied Physics, 85 (1). 296-301 doi:10.1063/1.369444
Misra, A., Hundley, M. F., Hristova, D., Kung, H., Mitchell, T. E., Nastasi, M., Embury, J. D. (1999) Electrical resistivity of sputtered Cu/Cr multilayered thin films. Journal of Applied Physics, 85 (1). 302-309 doi:10.1063/1.369446
Vakhitov, Robert M., Kucherov, Vladimir Ye. (1999) Structure and properties of magnetic inhomogeneities of the “static soliton” type in (001) plates with a combined anisotropy. Journal of Applied Physics, 85 (1). 310-313 doi:10.1063/1.369447
Rausch, T., Szczurek, T., Schlesinger, M. (1999) High frequency giant magnetoresistance in evaporated Co/Cu multilayers deposited on Si(111) and Si(100). Journal of Applied Physics, 85 (1). 314-318 doi:10.1063/1.369448
GonzĂĄlez, M. T., Garcı́a, K. L., Valenzuela, R. (1999) Circumferential magnetization curves of Co-rich amorphous wires under tensile stress. Journal of Applied Physics, 85 (1). 319-324 doi:10.1063/1.369449
Fayek, M. K., Ata-Allah, S. S., Refai, H. S. (1999) On the cation distribution in Ni1−xCuxFe2−yAlyO4 spinels. Journal of Applied Physics, 85 (1). 325-328 doi:10.1063/1.369450
Oh, Sei J., Cook, D. C. (1999) Mössbauer effect determination of relative recoilless fractions for iron oxides. Journal of Applied Physics, 85 (1). 329-332 doi:10.1063/1.369451
Hsu, Y. W., Lu, S. S., Chang, P. Z. (1999) Piezoresistive response induced by piezoelectric charges in n-type GaAs mesa resistors for application in stress transducers. Journal of Applied Physics, 85 (1). 333-340 doi:10.1063/1.369452
Sharma, H. Basantakumar, Sarma, H. N. K., Mansingh, Abhai (1999) Fatigue in sol-gel derived barium titanate films. Journal of Applied Physics, 85 (1). 341-346 doi:10.1063/1.369453
Kim, Seong Hyun, Hwang, Yoon-Hwae, Kim, Jung-Ae, Yang, Yong Suk, Chae, Byung Gyu, Jang, Min Su (1999) Study of frequency dependent Δ*(ω) in amorphous ferroelectrics: Modified generalized Langevin equation analysis. Journal of Applied Physics, 85 (1). 347-351 doi:10.1063/1.369454
Vassilikou-Dova, Aglaia, Kalogeras, Ioannis M., Macalik, Bogus’aw, Londos, Charalambos A. (1999) Polarizing-field orientation and thermal treatment effects on the dielectric behavior of fluorapatite. Journal of Applied Physics, 85 (1). 352-361 doi:10.1063/1.369455
Colla, Eugene V., Gupta, Surya M., Viehland, Dwight (1999) Alternating current field effect on the freezing temperature of relaxor ferroelectrics. Journal of Applied Physics, 85 (1). 362-367 doi:10.1063/1.369456
Topolov, V. Yu., Turik, A. V. (1999) Nonmonotonic concentration dependence of piezoelectric coefficients of 1–3 composites. Journal of Applied Physics, 85 (1). 372-379 doi:10.1063/1.369458
Sridhar, S., Giannakopoulos, A. E., Suresh, S., Ramamurty, U. (1999) Electrical response during indentation of piezoelectric materials: A new method for material characterization. Journal of Applied Physics, 85 (1). 380-387 doi:10.1063/1.369459
Li, Tong, Kanicki, Jerzy (1999) Microstructure characterization of amorphous thin solid films in a fringe-free environment. Journal of Applied Physics, 85 (1). 388-396 doi:10.1063/1.369460
Destruel, P., Jolinat, P., Clergereaux, R., Farenc, J. (1999) Pressure dependence of electrical and optical characteristics of Alq3 based organic electroluminescent diodes. Journal of Applied Physics, 85 (1). 397-400 doi:10.1063/1.369396
Quintero-Torres, R., Thakur, M. (1999) Measurement of the nonlinear refractive index of polydiacetylene using Michelson interferometry and z-scan. Journal of Applied Physics, 85 (1). 401-403 doi:10.1063/1.369397
Köhler, U., As, D. J., Schöttker, B., Frey, T., Lischka, K., Scheiner, J., Shokhovets, S., Goldhahn, R. (1999) Optical constants of cubic GaN in the energy range of 1.5–3.7 eV. Journal of Applied Physics, 85 (1). 404-407 doi:10.1063/1.369398
von Rottkay, K., Rubin, M., Duine, P. A. (1999) Refractive index changes of Pd-coated magnesium lanthanide switchable mirrors upon hydrogen insertion. Journal of Applied Physics, 85 (1). 408-413 doi:10.1063/1.369399
Yoshino, K., Fujii, A., Nakayama, H., Lee, S., Naka, A., Ishikawa, M. (1999) Optical properties of poly(disilanyleneoligothienylene)s and their doping characteristics. Journal of Applied Physics, 85 (1). 414-418 doi:10.1063/1.369400
Liu, Yanjing, Claus, Richard O. (1999) Strong enhancement of optical absorbance from ionic self-assembled multilayer thin films of nanocluster Pt and polymer dye. Journal of Applied Physics, 85 (1). 419-424 doi:10.1063/1.369401
Wasylak, J., Kucharski, J., Kityk, I. V., Sahraoui, B. (1999) Photoinduced effects in the Sb2Se3–BaCl2–PbCl2 glasses. Journal of Applied Physics, 85 (1). 425-431 doi:10.1063/1.369402
de la Peña, J. L., Gonzålez, F., Saiz, J. M., Moreno, F., Valle, P. J. (1999) Sizing particles on substrates. A general method for oblique incidence. Journal of Applied Physics, 85 (1). 432-438 doi:10.1063/1.369403
Bhaskar, S., Dobal, P. S., Rai, B. K., Katiyar, R. S., Bist, H. D., Ndap, J.-O., Burger, A. (1999) Photoluminescence study of deep levels in Cr-doped ZnSe. Journal of Applied Physics, 85 (1). 439-443 doi:10.1063/1.369404
Takeuchi, Misaichi, Kawashima, Kenji, Fujiwara, Kenzo (1999) Selectively observed spatially indirect Stark-ladder transitions in asymmetric double-well GaAs/AlAs superlattices. Journal of Applied Physics, 85 (1). 444-450 doi:10.1063/1.369405
Fan, Wenhui, Wang, Yongchang, Hou, Xun, Du, Li, Zhao, Wei, Yang, Binzhou, Niu, Lihong (1999) Picosecond infrared laser stimulation of luminescence in CaS:Eu,Sm. Journal of Applied Physics, 85 (1). 451-454 doi:10.1063/1.369407
Carter, G. (1999) The effects of surface ripples on sputtering erosion rates and secondary ion emission yields. Journal of Applied Physics, 85 (1). 455-459 doi:10.1063/1.369408
Bullock, Anthony B., Bolton, Paul R. (1999) Laser-induced back ablation of aluminum thin films using picosecond laser pulses. Journal of Applied Physics, 85 (1). 460-465 doi:10.1063/1.369393
Heffelfinger, J. R., Medlin, D. L., McCarty, K. F. (1999) On the initial stages of AlN thin-film growth onto (0001) oriented Al2O3 substrates by molecular beam epitaxy. Journal of Applied Physics, 85 (1). 466-472 doi:10.1063/1.369409
Lee, Seoghyeong, Kim, Dong Joon, Yang, Sung-Hoon, Park, Jeongwon, Sohn, Seil, Oh, Kyunghui, Kim, Yong-Tae, Kim, Jung-Yeul, Yeom, Geun-Young, Park, Jong-Wan (1999) Thermal stability enhancement of Cu/WN/SiOF/Si multilayers by post-plasma treatment of fluorine-doped silicon dioxide. Journal of Applied Physics, 85 (1). 473-477 doi:10.1063/1.369410
Birnboim, A., Calame, J. P., Carmel, Y. (1999) Microfocusing and polarization effects in spherical neck ceramic microstructures during microwave processing. Journal of Applied Physics, 85 (1). 478-482 doi:10.1063/1.369411
Yamamuro, S., Sumiyama, K., Suzuki, K. (1999) Monodispersed Cr cluster formation by plasma-gas-condensation. Journal of Applied Physics, 85 (1). 483-489 doi:10.1063/1.369476
Calhoun, L. C., Park, R. M. (1999) Doping of ZnSe during molecular beam epitaxial growth using an atomic phosphorus source. Journal of Applied Physics, 85 (1). 490-497 doi:10.1063/1.369477
Parkansky, N., Alterkop, B., Goldsmith, S., Boxman, R. L., Rosenberg, Yu. (1999) Effect of transverse current injection during air annealing on the formation of oxides in thin Ti films. Journal of Applied Physics, 85 (1). 498-500 doi:10.1063/1.369478
Taylor, N., Kim, H., Spila, T., Eades, J. A., Glass, G., Desjardins, P., Greene, J. E. (1999) Growth of Si1−xGex(011) on Si(011)16×2 by gas-source molecular beam epitaxy: Growth kinetics, Ge incorporation, and surface phase transitions. Journal of Applied Physics, 85 (1). 501-511 doi:10.1063/1.369481
Cho, M. W., Chang, J. H., Bagnall, D. M., Koh, K. W., Saeki, S., Park, K. T., Zhu, Z., Hiraga, K., Yao, T. (1999) Growth and characterization of beryllium-based II–VI compounds. Journal of Applied Physics, 85 (1). 512-517 doi:10.1063/1.369479
Zhao, T. M., Hao, Y. Y., Xu, X. R., Yang, Y. S., Hu, Z. Q. (1999) Promotion of crystallization and magnetic property improvement enhancement of the energy product in Nd5.5Fe66B18.5Cr5Co5 by magnetic field heat treatment. Journal of Applied Physics, 85 (1). 518-521 doi:10.1063/1.369482
Mitsui, Toshiyuki, Hill, Eric, Ganz, Eric (1999) Nanolithography by selective chemical vapor deposition with an atomic hydrogen resist. Journal of Applied Physics, 85 (1). 522-524 doi:10.1063/1.369483
Falkenstein, Zoran (1999) Effects of the O2 concentration on the removal efficiency of volatile organic compounds with dielectric barrier discharges in Ar and N2. Journal of Applied Physics, 85 (1). 525-529 doi:10.1063/1.369484
Wen, Weijia, Zheng, D. W., Tu, K. N. (1999) Chain/column evolution and corresponding electrorheological effect. Journal of Applied Physics, 85 (1). 530-533 doi:10.1063/1.369485
Nadenau, V., Hariskos, D., Schock, H.-W., Krejci, M., Haug, F.-J., Tiwari, A. N., Zogg, H., Kostorz, G. (1999) Microstructural study of the CdS/CuGaSe2 interfacial region in CuGaSe2 thin film solar cells. Journal of Applied Physics, 85 (1). 534-542 doi:10.1063/1.369486
Wei, Jeng-Hua, Lee, Si-Chen (1999) Improved stability of deuterated amorphous silicon thin film transistors. Journal of Applied Physics, 85 (1). 543-550 doi:10.1063/1.369487
Kimura, Shinjiro, Ikoma, Hideaki (1999) Fowler–Nordheim current injection and write/erase characteristics of metal–oxide–nitride–oxide–Si structure grown with helicon-wave excited plasma processing. Journal of Applied Physics, 85 (1). 551-557 doi:10.1063/1.369488
Levine, Zachary H., Ravel, Bruce (1999) Identification of materials in integrated circuit interconnects using x-ray absorption near-edge spectroscopy. Journal of Applied Physics, 85 (1). 558-564 doi:10.1063/1.369489
Panteleit, F., Schroeder, T., Martin, J., Huebener, R. P., Kiewiet, F. B., van den Berg, M. L., de Korte, P. A. J. (1999) Quasiparticle losses at the surface of superconducting tunnel junction detectors. Journal of Applied Physics, 85 (1). 565-570 doi:10.1063/1.369490
Dirks, A. G., Webster, M. N., Turner, P., Rich, P., Butler, D. C. (1999) On the mechanism of aluminum via fill by reflow and forcefill as studied by transmission electron microscopy. Journal of Applied Physics, 85 (1). 571-577 doi:10.1063/1.369491
Shao, Xiaoping, Jonczyk, Ralf, Dashiell, M., Hits, D., Orner, B. A., Khan, A.-S., Roe, K., Kolodzey, J., Berger, Paul R., Kaba, M., Barteau, M. A., Unruh, K. M. (1999) Strain modification in thin Si1−x−yGexCy alloys on (100) Si for formation of high density and uniformly sized quantum dots. Journal of Applied Physics, 85 (1). 578-582 doi:10.1063/1.369492
Martı́n-Palma, R. J., PĂ©rez-Rigueiro, J., Guerrero-Lemus, R., Moreno, J. D., Martı́nez-Duart, J. M. (1999) Ageing of aluminum electrical contacts to porous silicon. Journal of Applied Physics, 85 (1). 583-586 doi:10.1063/1.369394
Zhang, Yifei, Singh, Jasprit (1999) Charge control and mobility studies for an AlGaN/GaN high electron mobility transistor. Journal of Applied Physics, 85 (1). 587-594 doi:10.1063/1.369493
Ohkubo, M., Fukuda, D., Sakamoto, I., Hayashi, N., Martin, J., Panteleit, F., Huebener, R. P. (1999) Double peak phenomenon in superconducting tunnel junction x-ray detectors. Journal of Applied Physics, 85 (1). 595-599 doi:10.1063/1.369494
Lee, J. Y., Kwon, Y. H., Kim, M. D., Kim, H. J., Kang, T. W., Hong, C. Y., Cho, H. Y. (1999) Enhancement of a rectifying characteristic of InGaP diodes by hydrogenation. Journal of Applied Physics, 85 (1). 600-603 doi:10.1063/1.369495
Zhao, Fuchuan, Xia, Guanqun, Du, Lixin, Tan, Huizu (1999) Improved analytical model for threshold behavior of sidegating effect in GaAs metal–semiconductor field-effect transistors induced by impact ionization of deep traps. Journal of Applied Physics, 85 (1). 604-607 doi:10.1063/1.369412
Giebeler, Carsten, Antoniadis, Homer, Bradley, Donal D. C., Shirota, Yasuhiko (1999) Influence of the hole transport layer on the performance of organic light-emitting diodes. Journal of Applied Physics, 85 (1). 608-615 doi:10.1063/1.369413
Foglietti, V., Mariucci, L., Fortunato, G. (1999) Temperature dependence of the transfer characteristics of polysilicon thin film transistors fabricated by excimer laser crystallization. Journal of Applied Physics, 85 (1). 616-618 doi:10.1063/1.369414
Liu, Feng-Qi, Wang, Zhan-Guo, Wu, Ju, Xu, Bo, Gong, Qian, Liang, Ji-Ben (1999) Structure and photoluminescence of InGaAs self-assembled quantum dots grown on InP(001). Journal of Applied Physics, 85 (1). 619-621 doi:10.1063/1.369415
Bobnar, Vid, Kutnjak, Zdravko, Levstik, Adrijan, Holc, Janez, Kosec, Marija, Hauke, Tilo, Steinhausen, Ralf, Beige, Horst (1999) Correlation between fatigue and piezoelectric properties in (Pb, La) (Zr, Ti)O3 thick films. Journal of Applied Physics, 85 (1). 622-624 doi:10.1063/1.369416
PatanĂš, A., Polimeni, A., Henini, M., Eaves, L., Main, P. C., Hill, G. (1999) Thermal effects in quantum dot lasers. Journal of Applied Physics, 85 (1). 625-627 doi:10.1063/1.369417
KrakovskĂœ, I., Romijn, T., Posthuma de Boer, A. (1999) A few remarks on the electrostriction of elastomers. Journal of Applied Physics, 85 (1). 628-629 doi:10.1063/1.369418
Manasreh, M. O., von Bardeleben, H. J., Mousalitin, A. M., Khokhlov, D. R. (1999) Electron irradiation effects on the intersubband transitions in InGaAs/AlGaAs multiple quantum wells. Journal of Applied Physics, 85 (1). 630-632 doi:10.1063/1.369419
Takanashi, Yoshifumi, Kondo, Naoto (1999) Deep trap in InGaAs grown by gas source molecular beam epitaxy. Journal of Applied Physics, 85 (1). 633-634 doi:10.1063/1.369420
Brötz, J., Fuess, H., Haage, T., Zegenhagen, J., Jooss, Ch., Forkl, A., Warthmann, R. (1999) Anisotropic defect structure and transport properties of YBa2Cu3O7−ή films on vicinal SrTiO3(001). Journal of Applied Physics, 85 (1). 635-637 doi:10.1063/1.369421
Lee, Jung-Kun, Youn, Hyuk-Jun, Hong, Kug Sun, Park, Seung-Eek (1999) Charged defects and ferroelectricity in (1−x)PbZrO3−x(Na1/2Bi1/2)TiO3 solid solution. Journal of Applied Physics, 85 (1). 368-371 doi:10.1063/1.369457

See Also

These are possibly similar items as determined by title/reference text matching only.

(1999, January) Journal of Applied Physics Vol. 85 (2) AIP Publishing
(1999, January) Applied Physics Letters Vol. 74 (1) AIP Publishing
(1999, May) Journal of Applied Physics Vol. 85 (10) AIP Publishing
(1999, June) Journal of Applied Physics Vol. 85 (11) AIP Publishing
(1999, June) Journal of Applied Physics Vol. 85 (12) AIP Publishing
(1999, February) Journal of Applied Physics Vol. 85 (3) AIP Publishing
(1999, February) Journal of Applied Physics Vol. 85 (4) AIP Publishing
(1999, March) Journal of Applied Physics Vol. 85 (5) AIP Publishing
(1999, March) Journal of Applied Physics Vol. 85 (6) AIP Publishing
(1999, April) Journal of Applied Physics Vol. 85 (7) AIP Publishing
(1999, April) Journal of Applied Physics Vol. 85 (8) AIP Publishing
 
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