Reference Type | Journal (article/letter/editorial) |
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Title | New modes of FFT impedance spectroscopy applied to semiconductor pore etching and materials characterization |
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Journal | physica status solidi (a) |
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Authors | Carstensen, J. | Author |
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Foca, E. | Author |
Keipert, S. | Author |
Föll, H. | Author |
Leisner, M. | Author |
Cojocaru, A. | Author |
Year | 2008 (November) | Volume | 205 |
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Issue | 11 |
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Publisher | Wiley |
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DOI | doi:10.1002/pssa.200824033Search in ResearchGate |
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| Generate Citation Formats |
Mindat Ref. ID | 5094557 | Long-form Identifier | mindat:1:5:5094557:1 |
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GUID | 0 |
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Full Reference | Carstensen, J., Foca, E., Keipert, S., Föll, H., Leisner, M., Cojocaru, A. (2008) New modes of FFT impedance spectroscopy applied to semiconductor pore etching and materials characterization. physica status solidi (a), 205 (11). 2485-2503 doi:10.1002/pssa.200824033 |
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Plain Text | Carstensen, J., Foca, E., Keipert, S., Föll, H., Leisner, M., Cojocaru, A. (2008) New modes of FFT impedance spectroscopy applied to semiconductor pore etching and materials characterization. physica status solidi (a), 205 (11). 2485-2503 doi:10.1002/pssa.200824033 |
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In | (2008, November) physica status solidi (a) Vol. 205 (11) Wiley |
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