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Rein, S., Rehrl, T., Warta, W., Glunz, S. W. (2002) Lifetime spectroscopy for defect characterization: Systematic analysis of the possibilities and restrictions. Journal of Applied Physics, 91 (4). 2059-2070 doi:10.1063/1.1428095

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Reference TypeJournal (article/letter/editorial)
TitleLifetime spectroscopy for defect characterization: Systematic analysis of the possibilities and restrictions
JournalJournal of Applied Physics
AuthorsRein, S.Author
Rehrl, T.Author
Warta, W.Author
Glunz, S. W.Author
Year2002 (February 15)Volume91
Issue4
PublisherAIP Publishing
DOIdoi:10.1063/1.1428095Search in ResearchGate
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Mindat Ref. ID5113589Long-form Identifiermindat:1:5:5113589:8
GUID0
Full ReferenceRein, S., Rehrl, T., Warta, W., Glunz, S. W. (2002) Lifetime spectroscopy for defect characterization: Systematic analysis of the possibilities and restrictions. Journal of Applied Physics, 91 (4). 2059-2070 doi:10.1063/1.1428095
Plain TextRein, S., Rehrl, T., Warta, W., Glunz, S. W. (2002) Lifetime spectroscopy for defect characterization: Systematic analysis of the possibilities and restrictions. Journal of Applied Physics, 91 (4). 2059-2070 doi:10.1063/1.1428095
In(2002, February) Journal of Applied Physics Vol. 91 (4) AIP Publishing

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Glunz, S. W., Rein, S., Lee, J. Y., Warta, W. (2001) Minority carrier lifetime degradation in boron-doped Czochralski silicon. Journal of Applied Physics, 90 (5). 2397-2404 doi:10.1063/1.1389076
Diez, S., Rein, S., Roth, T., Glunz, S. W. (2007) Cobalt related defect levels in silicon analyzed by temperature- and injection-dependent lifetime spectroscopy. Journal of Applied Physics, 101 (3). 33710pp. doi:10.1063/1.2433743
Glunz, S. W., Biro, D., Rein, S., Warta, W. (1999) Field-effect passivation of the SiO2Si interface. Journal of Applied Physics, 86 (1). 683-691 doi:10.1063/1.370784
Rein, S., Glunz, S. W. (2003) Electronic properties of the metastable defect in boron-doped Czochralski silicon: Unambiguous determination by advanced lifetime spectroscopy. Applied Physics Letters, 82 (7). 1054-1056 doi:10.1063/1.1544431
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Giesecke, J. A., Glunz, S. W., Warta, W. (2013) Understanding and resolving the discrepancy between differential and actual minority carrier lifetime. Journal of Applied Physics, 113 (7). 73706pp. doi:10.1063/1.4790716
Rein, S., Glunz, S. W. (2005) Electronic properties of interstitial iron and iron-boron pairs determined by means of advanced lifetime spectroscopy. Journal of Applied Physics, 98 (11). 113711pp. doi:10.1063/1.2106017
Glunz, Stefan W., Warta, Wilhelm (1995) High‐resolution lifetime mapping using modulated free‐carrier absorption. Journal of Applied Physics, 77 (7). 3243-3247 doi:10.1063/1.358677
Würfel, P., Trupke, T., Puzzer, T., Schäffer, E., Warta, W., Glunz, S. W. (2007) Diffusion lengths of silicon solar cells from luminescence images. Journal of Applied Physics, 101 (12). 123110pp. doi:10.1063/1.2749201
Roth, Thomas, Rüdiger, Marc, Warta, Wilhelm, Glunz, Stefan W. (2008) Electronic properties of titanium in boron-doped silicon analyzed by temperature-dependent photoluminescence and injection-dependent photoconductance lifetime spectroscopy. Journal of Applied Physics, 104 (7). 74510pp. doi:10.1063/1.2996252
Rosenits, Philipp, Roth, Thomas, Warta, Wilhelm, Reber, Stefan, Glunz, Stefan W. (2009) Determining the excess carrier lifetime in crystalline silicon thin-films by photoluminescence measurements. Journal of Applied Physics, 105 (5). 53714pp. doi:10.1063/1.3080174
 
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