| Reference Type | Journal (article/letter/editorial) |
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| Title | Magnetic and structural characterization and ferromagnetic resonance study of thin film HITPERM soft magnetic materials for data storage applications |
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| Journal | Journal of Applied Physics |
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| Authors | Okumura, H. | Author |
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| Twisselmann, D. J. | Author |
| McMichael, R. D. | Author |
| Huang, M. Q. | Author |
| Hsu, Y. N. | Author |
| Laughlin, D. E. | Author |
| McHenry, M. E. | Author |
| Year | 2003 (May 15) | Volume | 93 |
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| Issue | 10 |
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| Publisher | AIP Publishing |
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| DOI | doi:10.1063/1.1555871Search in ResearchGate |
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| Generate Citation Formats |
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| Mindat Ref. ID | 5118328 | Long-form Identifier | mindat:1:5:5118328:4 |
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| GUID | 0 |
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| Full Reference | Okumura, H., Twisselmann, D. J., McMichael, R. D., Huang, M. Q., Hsu, Y. N., Laughlin, D. E., McHenry, M. E. (2003) Magnetic and structural characterization and ferromagnetic resonance study of thin film HITPERM soft magnetic materials for data storage applications. Journal of Applied Physics, 93 (10). 6528-6530 doi:10.1063/1.1555871 |
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| Plain Text | Okumura, H., Twisselmann, D. J., McMichael, R. D., Huang, M. Q., Hsu, Y. N., Laughlin, D. E., McHenry, M. E. (2003) Magnetic and structural characterization and ferromagnetic resonance study of thin film HITPERM soft magnetic materials for data storage applications. Journal of Applied Physics, 93 (10). 6528-6530 doi:10.1063/1.1555871 |
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| In | (2003, May) Journal of Applied Physics Vol. 93 (10) AIP Publishing |
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