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Lin, Chao-Cheng, Lai, Chih-Huang, Wei, D. H., Hsu, Y. J., Shieh, Han-Ping D. (2004) Thickness dependence of Co anisotropy in TbFe/Co exchange-coupled bilayers. Journal of Applied Physics, 95 (11). 6846-6848 doi:10.1063/1.1689911

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Reference TypeJournal (article/letter/editorial)
TitleThickness dependence of Co anisotropy in TbFe/Co exchange-coupled bilayers
JournalJournal of Applied Physics
AuthorsLin, Chao-ChengAuthor
Lai, Chih-HuangAuthor
Wei, D. H.Author
Hsu, Y. J.Author
Shieh, Han-Ping D.Author
Year2004 (June)Volume95
Issue11
PublisherAIP Publishing
DOIdoi:10.1063/1.1689911Search in ResearchGate
Generate Citation Formats
Mindat Ref. ID5124927Long-form Identifiermindat:1:5:5124927:0
GUID0
Full ReferenceLin, Chao-Cheng, Lai, Chih-Huang, Wei, D. H., Hsu, Y. J., Shieh, Han-Ping D. (2004) Thickness dependence of Co anisotropy in TbFe/Co exchange-coupled bilayers. Journal of Applied Physics, 95 (11). 6846-6848 doi:10.1063/1.1689911
Plain TextLin, Chao-Cheng, Lai, Chih-Huang, Wei, D. H., Hsu, Y. J., Shieh, Han-Ping D. (2004) Thickness dependence of Co anisotropy in TbFe/Co exchange-coupled bilayers. Journal of Applied Physics, 95 (11). 6846-6848 doi:10.1063/1.1689911
In(2004, June) Journal of Applied Physics Vol. 95 (11) AIP Publishing

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