Reference Type | Journal (article/letter/editorial) |
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Title | In situtransmission electron microscopy study of the crystallization of Ge2Sb2Te5 |
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Journal | Journal of Applied Physics |
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Authors | Kooi, B. J. | Author |
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Groot, W. M. G. | Author |
De Hosson, J. Th. M. | Author |
Year | 2004 (February) | Volume | 95 |
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Issue | 3 |
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Publisher | AIP Publishing |
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DOI | doi:10.1063/1.1636259Search in ResearchGate |
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| Generate Citation Formats |
Mindat Ref. ID | 5125637 | Long-form Identifier | mindat:1:5:5125637:7 |
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GUID | 0 |
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Full Reference | Kooi, B. J., Groot, W. M. G., De Hosson, J. Th. M. (2004) In situtransmission electron microscopy study of the crystallization of Ge2Sb2Te5. Journal of Applied Physics, 95 (3). 924-932 doi:10.1063/1.1636259 |
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Plain Text | Kooi, B. J., Groot, W. M. G., De Hosson, J. Th. M. (2004) In situtransmission electron microscopy study of the crystallization of Ge2Sb2Te5. Journal of Applied Physics, 95 (3). 924-932 doi:10.1063/1.1636259 |
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In | (2004, February) Journal of Applied Physics Vol. 95 (3) AIP Publishing |
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