| Reference Type | Journal (article/letter/editorial) |
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| Title | Ferroelectric domain wall relaxation in Ba0.25Sr0.75TiO3 films displaying Curie-Weiss behavior |
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| Journal | Journal of Applied Physics |
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| Authors | Boikov, Yu. A. | Author |
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| Khamchane, K. | Author |
| Claeson, T. | Author |
| Year | 2004 (October 15) | Volume | 96 |
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| Issue | 8 |
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| Publisher | AIP Publishing |
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| DOI | doi:10.1063/1.1787587Search in ResearchGate |
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| Generate Citation Formats |
| Mindat Ref. ID | 5129487 | Long-form Identifier | mindat:1:5:5129487:2 |
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|
| GUID | 0 |
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| Full Reference | Boikov, Yu. A., Khamchane, K., Claeson, T. (2004) Ferroelectric domain wall relaxation in Ba0.25Sr0.75TiO3 films displaying Curie-Weiss behavior. Journal of Applied Physics, 96 (8). 4392-4399 doi:10.1063/1.1787587 |
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| Plain Text | Boikov, Yu. A., Khamchane, K., Claeson, T. (2004) Ferroelectric domain wall relaxation in Ba0.25Sr0.75TiO3 films displaying Curie-Weiss behavior. Journal of Applied Physics, 96 (8). 4392-4399 doi:10.1063/1.1787587 |
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| In | (2004, October) Journal of Applied Physics Vol. 96 (8) AIP Publishing |
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