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Hatzistergos, M. S., Lifshin, E. (2006) Measurements of relative x-ray line intensities and their application to a single standard procedure for quantitative x-ray microanalysis. Journal of Applied Physics, 100 (12). 124312pp. doi:10.1063/1.2400089

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Reference TypeJournal (article/letter/editorial)
TitleMeasurements of relative x-ray line intensities and their application to a single standard procedure for quantitative x-ray microanalysis
JournalJournal of Applied Physics
AuthorsHatzistergos, M. S.Author
Lifshin, E.Author
Year2006 (December 15)Volume100
Issue12
PublisherAIP Publishing
DOIdoi:10.1063/1.2400089Search in ResearchGate
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Mindat Ref. ID5142337Long-form Identifiermindat:1:5:5142337:7
GUID0
Full ReferenceHatzistergos, M. S., Lifshin, E. (2006) Measurements of relative x-ray line intensities and their application to a single standard procedure for quantitative x-ray microanalysis. Journal of Applied Physics, 100 (12). 124312pp. doi:10.1063/1.2400089
Plain TextHatzistergos, M. S., Lifshin, E. (2006) Measurements of relative x-ray line intensities and their application to a single standard procedure for quantitative x-ray microanalysis. Journal of Applied Physics, 100 (12). 124312pp. doi:10.1063/1.2400089
In(2006, December) Journal of Applied Physics Vol. 100 (12) AIP Publishing

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Hatzistergos, M, Lifshin, E (2006) New Measurements of Deconvoluted EDS Spectra of Elemental Standards as a Function of Atomic Number and Electron Beam Energy. Microscopy and Microanalysis, 12. 830-831 doi:10.1017/s1431927606061538
He, Baoping, Rao, Satish, Houska, C. R. (1994) A simplified procedure for obtaining relative x‐ray intensities when a texture and atomic displacements are present. Journal of Applied Physics, 75 (9). 4456-4464 doi:10.1063/1.355960
Hatzistergos, M S, Lifshin, E (2005) Electron Probe Microanalysis of Cr Films on Semiconducting and Insulating Substrates. Microscopy and Microanalysis, 11. doi:10.1017/s1431927605510602
Horny, Paula, Lifshin, Eric, Campbell, Helen, Gauvin, Raynald (2010) Development of a New Quantitative X-Ray Microanalysis Method for Electron Microscopy. Microscopy and Microanalysis, 16 (6). 821-830 doi:10.1017/s1431927610094018
Alexander, Leroy (1954) The Synthesis of X‐Ray Spectrometer Line Profiles with Application to Crystallite Size Measurements. Journal of Applied Physics, 25 (2). 155-161 doi:10.1063/1.1721595
Horny, Paula, Gauvin, Raynald, Lifshin, Eric, Wu, Di (2002) Quantitative X-Ray Microanalysis with a Low Voltage Scanning Electron Microscope. Microscopy and Microanalysis, 8. 1474-1475 doi:10.1017/s1431927602104004
Gauvin, Raynald, Lifshin, Eric, Demers, Hendrix, Horny, Paula, Campbell, Helen (2006) Win X-ray: A New Monte Carlo Program that Computes X-ray Spectra Obtained with a Scanning Electron Microscope. Microscopy and Microanalysis, 12 (1). 49-64 doi:10.1017/s1431927606060089
Beu, Karl E. (1953) On the Use of X‐Ray Film for the Quantitative Measurement of Diffraction Line Intensities. Review of Scientific Instruments, 24 (2). 103-108 doi:10.1063/1.1770633
Oswald, S., Oswald, F. (2006) Computer simulation of angle-resolved x-ray photoelectron spectroscopy measurements for the study of surface and interface roughnesses. Journal of Applied Physics, 100 (10). 104504pp. doi:10.1063/1.2386938
Meeker, G (2007) Application of Quantitative X-Ray Microanalysis in Response to Extreme Events. Microscopy and Microanalysis, 13. doi:10.1017/s1431927607078075
Jensen, B. J., Gupta, Y. M. (2006) X-ray diffraction measurements in shock compressed magnesium doped LiF crystals. Journal of Applied Physics, 100 (5). 53512pp. doi:10.1063/1.2244524
 
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