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Xiao-Yong, Gao, Jian-Tao, Zhao, Yu-Fen, Liu, Qing-Geng, Lin, Yong-Sheng, Chen, Jin-Hua, Gu, Shi-E, Yang, Jing-Xiao, Lu (2009) Characterized Microstructure and Electrical Properties of Hydrogenated Nanocrystalline Silicon Films by Raman and Electrical Conductivity Spectra. Acta Physica Polonica A, 115 (3). 738-741 doi:10.12693/aphyspola.115.738

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Reference TypeJournal (article/letter/editorial)
TitleCharacterized Microstructure and Electrical Properties of Hydrogenated Nanocrystalline Silicon Films by Raman and Electrical Conductivity Spectra
JournalActa Physica Polonica A
AuthorsXiao-Yong, GaoAuthor
Jian-Tao, ZhaoAuthor
Yu-Fen, LiuAuthor
Qing-Geng, LinAuthor
Yong-Sheng, ChenAuthor
Jin-Hua, GuAuthor
Shi-E, YangAuthor
Jing-Xiao, LuAuthor
Year2009 (March)Volume115
Issue3
PublisherInstitute of Physics, Polish Academy of Sciences
DOIdoi:10.12693/aphyspola.115.738Search in ResearchGate
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Mindat Ref. ID5147248Long-form Identifiermindat:1:5:5147248:9
GUID0
Full ReferenceXiao-Yong, Gao, Jian-Tao, Zhao, Yu-Fen, Liu, Qing-Geng, Lin, Yong-Sheng, Chen, Jin-Hua, Gu, Shi-E, Yang, Jing-Xiao, Lu (2009) Characterized Microstructure and Electrical Properties of Hydrogenated Nanocrystalline Silicon Films by Raman and Electrical Conductivity Spectra. Acta Physica Polonica A, 115 (3). 738-741 doi:10.12693/aphyspola.115.738
Plain TextXiao-Yong, Gao, Jian-Tao, Zhao, Yu-Fen, Liu, Qing-Geng, Lin, Yong-Sheng, Chen, Jin-Hua, Gu, Shi-E, Yang, Jing-Xiao, Lu (2009) Characterized Microstructure and Electrical Properties of Hydrogenated Nanocrystalline Silicon Films by Raman and Electrical Conductivity Spectra. Acta Physica Polonica A, 115 (3). 738-741 doi:10.12693/aphyspola.115.738
In(2009, March) Acta Physica Polonica A Vol. 115 (3) Institute of Physics, Polish Academy of Sciences

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