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Pluska, M., Czerwinski, A., Ratajczak, J., Szerling, A., Kątcki, J. (2009) Dependence of Nanoelectronic-Structure Defect Detection by Cathodoluminescence on Electron Beam Current. Acta Physica Polonica A, 116. doi:10.12693/aphyspola.116.s-86

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Reference TypeJournal (article/letter/editorial)
TitleDependence of Nanoelectronic-Structure Defect Detection by Cathodoluminescence on Electron Beam Current
JournalActa Physica Polonica A
AuthorsPluska, M.Author
Czerwinski, A.Author
Ratajczak, J.Author
Szerling, A.Author
Kątcki, J.Author
Year2009 (December)Volume116
PublisherInstitute of Physics, Polish Academy of Sciences
DOIdoi:10.12693/aphyspola.116.s-86Search in ResearchGate
Generate Citation Formats
Mindat Ref. ID5147617Long-form Identifiermindat:1:5:5147617:5
GUID0
Full ReferencePluska, M., Czerwinski, A., Ratajczak, J., Szerling, A., Kątcki, J. (2009) Dependence of Nanoelectronic-Structure Defect Detection by Cathodoluminescence on Electron Beam Current. Acta Physica Polonica A, 116. doi:10.12693/aphyspola.116.s-86
Plain TextPluska, M., Czerwinski, A., Ratajczak, J., Szerling, A., Kątcki, J. (2009) Dependence of Nanoelectronic-Structure Defect Detection by Cathodoluminescence on Electron Beam Current. Acta Physica Polonica A, 116. doi:10.12693/aphyspola.116.s-86
In(2009) Acta Physica Polonica A Vol. 116. Institute of Physics, Polish Academy of Sciences

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Pluska, M., Czerwinski, A., Szerling, A., Ratajczak, J., Kątcki, J. (2014) Effect of Secondary Electroluminescence on Cathodoluminescence and Other Luminescence Measurements. Acta Physica Polonica A, 125 (4). 1027-1032 doi:10.12693/aphyspola.125.1027
Ratajczak, J., Łaszcz, A., Czerwinski, A., Kątcki, J., Tang, X., Reckinger, N., Yarekha, D.A., Larrieu, G., Dubois, E. (2009) TEM Characterization of Polysilicon and Silicide Fin Fabrication Processes of FinFETs. Acta Physica Polonica A, 116. doi:10.12693/aphyspola.116.s-89
CZERWINSKI, A., PLUSKA, M., RATAJCZAK, J., SZERLING, A., KąTCKI, J. (2010) Dependence of cathodoluminescence on layer resistance applied for measurement of thin-layer sheet resistance. Journal of Microscopy, 237 (3). 304-307 doi:10.1111/j.1365-2818.2009.03248.x
Czerwinski, A., Pluska, M., Ratajczak, J., Szerling, A., Kątcki, J. (2008) Impact of resistance on cathodoluminescence and its application for layer sheet-resistance measurements. Applied Physics Letters, 93 (4). 41109pp. doi:10.1063/1.2966339
Pluska, Mariusz, Czerwinski, Andrzej, Ratajczak, Jacek, Szerling, Anna, Kątcki, Jerzy (2012) Defect detection in semiconductor layers with built-in electric field with the use of cathodoluminescence. Physica B: Condensed Matter, 407 (15). 2854-2857 doi:10.1016/j.physb.2011.08.095
Czerwinski, A., Płuska, M., Ratajczak, J., Szerling, A., Kątcki, J. (2006) Resistance and sheet resistance measurements using electron beam induced current. Applied Physics Letters, 89 (24). 241919pp. doi:10.1063/1.2405886
Kirchner, M., Kahl, M. (2009) Raith - Electron Beam Lithography for Research. Acta Physica Polonica A, 116. doi:10.12693/aphyspola.116.s-198
Rzodkiewicz, W., Kulik, M., Papis, E., Szerling, A. (2009) Optical Analyses of Si and GaAs Semiconductors by Fractional-Derivative-Spectrum Methods. Acta Physica Polonica A, 116. doi:10.12693/aphyspola.116.s-95
Szerling, A., Karbownik, P., Kosiel, K., Kubacka-Traczyk, J., Pruszyńska-Karbownik, E., Płuska, M., Bugajski, M. (2009) Mid-Infrared GaAs/AlGaAs Quantum Cascade Lasers Technology. Acta Physica Polonica A, 116. doi:10.12693/aphyspola.116.s-45
Czerwinski, A., Pluska, M., Ratajczak, J., Szerling, A., Ktcki, J. (2011) Electron Microscopy Studies of Non-Local Effects’ Impact on Cathodoluminescence of Semiconductor Laser Structures. MATERIALS TRANSACTIONS, 52 (3). 364-369 doi:10.2320/matertrans.mb201007
Kosiel, K., Szerling, A., Kubacka-Traczyk, J., Karbownik, P., Pruszyńska-Karbownik, E., Bugajski, M. (2009) Molecular Beam Epitaxy Growth for Quantum Cascade Lasers. Acta Physica Polonica A, 116 (5). 806-813 doi:10.12693/aphyspola.116.806
 
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