Reference Type | Journal (article/letter/editorial) |
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Title | Characterization of InGaN quantum wells with gross fluctuations in width |
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Journal | Journal of Applied Physics |
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Authors | van der Laak, N. K. | Author |
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Oliver, R. A. | Author |
Kappers, M. J. | Author |
Humphreys, C. J. | Author |
Year | 2007 (July) | Volume | 102 |
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Issue | 1 |
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Publisher | AIP Publishing |
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DOI | doi:10.1063/1.2751401Search in ResearchGate |
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| Generate Citation Formats |
Mindat Ref. ID | 5149508 | Long-form Identifier | mindat:1:5:5149508:2 |
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GUID | 0 |
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Full Reference | van der Laak, N. K., Oliver, R. A., Kappers, M. J., Humphreys, C. J. (2007) Characterization of InGaN quantum wells with gross fluctuations in width. Journal of Applied Physics, 102 (1). 13513pp. doi:10.1063/1.2751401 |
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Plain Text | van der Laak, N. K., Oliver, R. A., Kappers, M. J., Humphreys, C. J. (2007) Characterization of InGaN quantum wells with gross fluctuations in width. Journal of Applied Physics, 102 (1). 13513pp. doi:10.1063/1.2751401 |
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In | (2007, July) Journal of Applied Physics Vol. 102 (1) AIP Publishing |
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