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Kunets, Vas. P., Morgan, T. Al., Mazur, Yu. I., Dorogan, V. G., Lytvyn, P. M., Ware, M. E., Guzun, D., Shultz, J. L., Salamo, G. J. (2008) Deep traps in GaAs/InGaAs quantum wells and quantum dots, studied by noise spectroscopy. Journal of Applied Physics, 104 (10). 103709pp. doi:10.1063/1.3020532

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Reference TypeJournal (article/letter/editorial)
TitleDeep traps in GaAs/InGaAs quantum wells and quantum dots, studied by noise spectroscopy
JournalJournal of Applied Physics
AuthorsKunets, Vas. P.Author
Morgan, T. Al.Author
Mazur, Yu. I.Author
Dorogan, V. G.Author
Lytvyn, P. M.Author
Ware, M. E.Author
Guzun, D.Author
Shultz, J. L.Author
Salamo, G. J.Author
Year2008 (November 15)Volume104
Issue10
PublisherAIP Publishing
DOIdoi:10.1063/1.3020532Search in ResearchGate
Generate Citation Formats
Mindat Ref. ID5157611Long-form Identifiermindat:1:5:5157611:0
GUID0
Full ReferenceKunets, Vas. P., Morgan, T. Al., Mazur, Yu. I., Dorogan, V. G., Lytvyn, P. M., Ware, M. E., Guzun, D., Shultz, J. L., Salamo, G. J. (2008) Deep traps in GaAs/InGaAs quantum wells and quantum dots, studied by noise spectroscopy. Journal of Applied Physics, 104 (10). 103709pp. doi:10.1063/1.3020532
Plain TextKunets, Vas. P., Morgan, T. Al., Mazur, Yu. I., Dorogan, V. G., Lytvyn, P. M., Ware, M. E., Guzun, D., Shultz, J. L., Salamo, G. J. (2008) Deep traps in GaAs/InGaAs quantum wells and quantum dots, studied by noise spectroscopy. Journal of Applied Physics, 104 (10). 103709pp. doi:10.1063/1.3020532
In(2008, November) Journal of Applied Physics Vol. 104 (10) AIP Publishing

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