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Xu, J. Q., Zhao, Y. M., Zhang, Q. Y. (2008) Enhanced electron field emission from single-crystalline LaB6 nanowires with ambient temperature. Journal of Applied Physics, 104 (12). 124306pp. doi:10.1063/1.3048547

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Reference TypeJournal (article/letter/editorial)
TitleEnhanced electron field emission from single-crystalline LaB6 nanowires with ambient temperature
JournalJournal of Applied Physics
AuthorsXu, J. Q.Author
Zhao, Y. M.Author
Zhang, Q. Y.Author
Year2008 (December 15)Volume104
Issue12
PublisherAIP Publishing
DOIdoi:10.1063/1.3048547Search in ResearchGate
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Mindat Ref. ID5158431Long-form Identifiermindat:1:5:5158431:3
GUID0
Full ReferenceXu, J. Q., Zhao, Y. M., Zhang, Q. Y. (2008) Enhanced electron field emission from single-crystalline LaB6 nanowires with ambient temperature. Journal of Applied Physics, 104 (12). 124306pp. doi:10.1063/1.3048547
Plain TextXu, J. Q., Zhao, Y. M., Zhang, Q. Y. (2008) Enhanced electron field emission from single-crystalline LaB6 nanowires with ambient temperature. Journal of Applied Physics, 104 (12). 124306pp. doi:10.1063/1.3048547
In(2008, December) Journal of Applied Physics Vol. 104 (12) AIP Publishing

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He, M. C., You, B., Tu, H. Q., Sheng, Y., Xu, Q. Y., Rui, W. B., Gao, Y., Zhang, Y. Q., Xu, Y. B., Du, J. (2015) Temperature dependent exchange bias training effect in single-crystalline BiFeO3/Co bilayers. Journal of Applied Physics, 117 (17). 17pp. doi:10.1063/1.4917465
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Zhang, H., Tang, J., Zhang, Q., Zhao, G., Yang, G., Zhang, J., Zhou, O., Qin, L.-C. (2006) Field Emission of Electrons from Single LaB6 Nanowires. Advanced Materials, 18. 87-91 doi:10.1002/adma.200500508
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Zhao, P., Shang, X. F., Ma, Y. P., Zhou, J. J., Gu, Z. Q., Li, Z. H., Xu, Y. B., Wang, M. (2008) High-current-density field emission display fabricated from single-walled carbon nanotube electron sources. The European Physical Journal Applied Physics, 42 (3). 251-254 doi:10.1051/epjap:2008058
Zhao, Q., Xu, J., Xu, X. Y., Wang, Z., Yu, D. P. (2004) Field emission from AlN nanoneedle arrays. Applied Physics Letters, 85 (22). 5331-5333 doi:10.1063/1.1825620
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