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Tang, F., Yuan, W., Lu, T.-M., Wang, G.-C. (2008) In situ reflection high energy electron diffraction study of dehydrogenation process of Pd coated Mg nanoblades. Journal of Applied Physics, 104 (3). 33534pp. doi:10.1063/1.2967735

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Reference TypeJournal (article/letter/editorial)
TitleIn situ reflection high energy electron diffraction study of dehydrogenation process of Pd coated Mg nanoblades
JournalJournal of Applied Physics
AuthorsTang, F.Author
Yuan, W.Author
Lu, T.-M.Author
Wang, G.-C.Author
Year2008 (August)Volume104
Issue3
PublisherAIP Publishing
DOIdoi:10.1063/1.2967735Search in ResearchGate
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Mindat Ref. ID5159085Long-form Identifiermindat:1:5:5159085:5
GUID0
Full ReferenceTang, F., Yuan, W., Lu, T.-M., Wang, G.-C. (2008) In situ reflection high energy electron diffraction study of dehydrogenation process of Pd coated Mg nanoblades. Journal of Applied Physics, 104 (3). 33534pp. doi:10.1063/1.2967735
Plain TextTang, F., Yuan, W., Lu, T.-M., Wang, G.-C. (2008) In situ reflection high energy electron diffraction study of dehydrogenation process of Pd coated Mg nanoblades. Journal of Applied Physics, 104 (3). 33534pp. doi:10.1063/1.2967735
In(2008, August) Journal of Applied Physics Vol. 104 (3) AIP Publishing

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Tang, F., Wang, G.-C., Lu, T.-M. (2007) In situ reflection high energy electron diffraction surface pole figure study of biaxial texture evolution in anisotropic Mg nanoblades during shadowing growth. Journal of Applied Physics, 102 (1). 14306pp. doi:10.1063/1.2752131
Tang, F., Wang, G.-C., Lu, T.-M. (2006) Surface pole figures by reflection high-energy electron diffraction. Applied Physics Letters, 89 (24). 241903pp. doi:10.1063/1.2403916
Fernández-Garrido, S., Koblmüller, G., Calleja, E., Speck, J. S. (2008) In situ GaN decomposition analysis by quadrupole mass spectrometry and reflection high-energy electron diffraction. Journal of Applied Physics, 104 (3). 33541pp. doi:10.1063/1.2968442
Drotar, Jason T., Lu, T.-M., Wang, G.-C. (2004) Real-time observation of initial stages of copper film growth on silicon oxide using reflection high-energy electron diffraction. Journal of Applied Physics, 96 (12). 7071-7079 doi:10.1063/1.1811785
Yamazaki, T., Suzuki, Y., Katayama, T., Taninaka, M., Nakagawa, K., Itoh, A. (1991) In situ observation of the strain of Co and Ni deposited on Pd (111) by reflection high energy electron diffraction. Journal of Applied Physics, 70 (6). 3180-3183 doi:10.1063/1.349300
Collins, D. A., Wang, M. W., Grant, R. W., McGill, T. C. (1994) Reflection high energy electron diffraction observation of anion exchange reactions on InAs surfaces. Journal of Applied Physics, 75 (1). 259-262 doi:10.1063/1.355893
Chen, P., Xu, S. Y., Zhou, W. Z., Ong, C. K., Cui, D. F. (1999) In situ reflection high-energy electron diffraction observation of epitaxial LaNiO3 thin films. Journal of Applied Physics, 85 (5). 3000-3002 doi:10.1063/1.369635
Boschker, J. E., Tybell, T. (2012) Qualitative determination of surface roughness by in situ reflection high energy electron diffraction. Applied Physics Letters, 100 (15). 151604pp. doi:10.1063/1.3701610
Elsayed‐Ali, H. E., Mourou, G. A. (1988) Picosecond reflection high‐energy electron diffraction. Applied Physics Letters, 52 (2). 103-104 doi:10.1063/1.99063
Liang, B. W., Chin, T. P., Tu, C. W. (1990) Reflection high‐energy electron‐diffraction study of metalorganic molecular‐beam epitaxy of GaAs using trimethylgallium and arsenic. Journal of Applied Physics, 67 (9). 4393-4395 doi:10.1063/1.344914
Fan, W. C., Zborowski, J. T., Golding, T. D., Shih, H. D. (1992) Reflection high‐energy electron diffraction study of growth and interface formation of the Ga1−xInxSb/InAs strained‐layer superlattices. Journal of Applied Physics, 71 (5). 2249-2252 doi:10.1063/1.351394
 
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