Reference Type | Journal (article/letter/editorial) |
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Title | Effect of in-plane shear strain on phase states and dielectric properties of epitaxial ferroelectric thin films |
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Journal | Journal of Applied Physics |
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Authors | Zembilgotov, A. G. | Author |
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Böttger, U. | Author |
Waser, R. | Author |
Year | 2008 (September) | Volume | 104 |
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Issue | 5 |
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Publisher | AIP Publishing |
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DOI | doi:10.1063/1.2976347Search in ResearchGate |
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| Generate Citation Formats |
Mindat Ref. ID | 5159659 | Long-form Identifier | mindat:1:5:5159659:4 |
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GUID | 0 |
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Full Reference | Zembilgotov, A. G., Böttger, U., Waser, R. (2008) Effect of in-plane shear strain on phase states and dielectric properties of epitaxial ferroelectric thin films. Journal of Applied Physics, 104 (5). 54118pp. doi:10.1063/1.2976347 |
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Plain Text | Zembilgotov, A. G., Böttger, U., Waser, R. (2008) Effect of in-plane shear strain on phase states and dielectric properties of epitaxial ferroelectric thin films. Journal of Applied Physics, 104 (5). 54118pp. doi:10.1063/1.2976347 |
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In | (2008, September) Journal of Applied Physics Vol. 104 (5) AIP Publishing |
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