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Wu, J. D., Huang, Y. S., Brammertz, G., Tiong, K. K. (2009) Optical characterization of thin epitaxial GaAs films on Ge substrates. Journal of Applied Physics, 106 (2). 23505pp. doi:10.1063/1.3173282

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Reference TypeJournal (article/letter/editorial)
TitleOptical characterization of thin epitaxial GaAs films on Ge substrates
JournalJournal of Applied Physics
AuthorsWu, J. D.Author
Huang, Y. S.Author
Brammertz, G.Author
Tiong, K. K.Author
Year2009 (July 15)Volume106
Issue2
PublisherAIP Publishing
DOIdoi:10.1063/1.3173282Search in ResearchGate
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Mindat Ref. ID5168104Long-form Identifiermindat:1:5:5168104:1
GUID0
Full ReferenceWu, J. D., Huang, Y. S., Brammertz, G., Tiong, K. K. (2009) Optical characterization of thin epitaxial GaAs films on Ge substrates. Journal of Applied Physics, 106 (2). 23505pp. doi:10.1063/1.3173282
Plain TextWu, J. D., Huang, Y. S., Brammertz, G., Tiong, K. K. (2009) Optical characterization of thin epitaxial GaAs films on Ge substrates. Journal of Applied Physics, 106 (2). 23505pp. doi:10.1063/1.3173282
In(2009, July) Journal of Applied Physics Vol. 106 (2) AIP Publishing

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Chan, C. H., Wu, J. D., Huang, Y. S., Su, Y. K., Tiong, K. K. (2009) Temperature dependent surface photovoltage spectroscopy characterization of highly strained InGaAs/GaAs double quantum well structures grown by metal organic vapor phase epitaxy. Journal of Applied Physics, 106 (4). 43523pp. doi:10.1063/1.3208053
Brammertz, Guy, Mols, Yves, Degroote, Stefan, Motsnyi, Vasyl, Leys, Maarten, Borghs, Gustaaf, Caymax, Matty (2006) Low-temperature photoluminescence study of thin epitaxial GaAs films on Ge substrates. Journal of Applied Physics, 99 (9). 93514pp. doi:10.1063/1.2194111
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