Izhnin, I. I., Dvoretsky, S. A., Mynbaev, K. D., Fitsych, O. I., Mikhailov, N. N., Varavin, V. S., Pociask-Bialy, M., Voitsekhovskii, A. V., Sheregii, E. (2014) Defect study in molecular beam epitaxy-grown HgCdTe films with activated and unactivated arsenic. Journal of Applied Physics, 115 (16). 163501pp. doi:10.1063/1.4872246
| Reference Type | Journal (article/letter/editorial) | ||
|---|---|---|---|
| Title | Defect study in molecular beam epitaxy-grown HgCdTe films with activated and unactivated arsenic | ||
| Journal | Journal of Applied Physics | ||
| Authors | Izhnin, I. I. | Author | |
| Dvoretsky, S. A. | Author | ||
| Mynbaev, K. D. | Author | ||
| Fitsych, O. I. | Author | ||
| Mikhailov, N. N. | Author | ||
| Varavin, V. S. | Author | ||
| Pociask-Bialy, M. | Author | ||
| Voitsekhovskii, A. V. | Author | ||
| Sheregii, E. | Author | ||
| Year | 2014 (April 28) | Volume | 115 |
| Issue | 16 | ||
| Publisher | AIP Publishing | ||
| DOI | doi:10.1063/1.4872246Search in ResearchGate | ||
| Generate Citation Formats | |||
| Mindat Ref. ID | 5196635 | Long-form Identifier | mindat:1:5:5196635:9 |
| GUID | 0 | ||
| Full Reference | Izhnin, I. I., Dvoretsky, S. A., Mynbaev, K. D., Fitsych, O. I., Mikhailov, N. N., Varavin, V. S., Pociask-Bialy, M., Voitsekhovskii, A. V., Sheregii, E. (2014) Defect study in molecular beam epitaxy-grown HgCdTe films with activated and unactivated arsenic. Journal of Applied Physics, 115 (16). 163501pp. doi:10.1063/1.4872246 | ||
| Plain Text | Izhnin, I. I., Dvoretsky, S. A., Mynbaev, K. D., Fitsych, O. I., Mikhailov, N. N., Varavin, V. S., Pociask-Bialy, M., Voitsekhovskii, A. V., Sheregii, E. (2014) Defect study in molecular beam epitaxy-grown HgCdTe films with activated and unactivated arsenic. Journal of Applied Physics, 115 (16). 163501pp. doi:10.1063/1.4872246 | ||
| In | (2014, April) Journal of Applied Physics Vol. 115 (16) AIP Publishing | ||
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