Semler, Matthew R., Hoey, Justin M., Guruvenket, Srinivasan, Gette, Cody R., Swenson, Orven F., Hobbie, Erik K. (2014) Structural and electronic characterization of 355 nm laser-crystallized silicon: Interplay of film thickness and laser fluence. Journal of Applied Physics, 115 (16). 163503pp. doi:10.1063/1.4872464
| Reference Type | Journal (article/letter/editorial) | ||
|---|---|---|---|
| Title | Structural and electronic characterization of 355 nm laser-crystallized silicon: Interplay of film thickness and laser fluence | ||
| Journal | Journal of Applied Physics | ||
| Authors | Semler, Matthew R. | Author | |
| Hoey, Justin M. | Author | ||
| Guruvenket, Srinivasan | Author | ||
| Gette, Cody R. | Author | ||
| Swenson, Orven F. | Author | ||
| Hobbie, Erik K. | Author | ||
| Year | 2014 (April 28) | Volume | 115 |
| Issue | 16 | ||
| Publisher | AIP Publishing | ||
| DOI | doi:10.1063/1.4872464Search in ResearchGate | ||
| Generate Citation Formats | |||
| Mindat Ref. ID | 5196652 | Long-form Identifier | mindat:1:5:5196652:6 |
| GUID | 0 | ||
| Full Reference | Semler, Matthew R., Hoey, Justin M., Guruvenket, Srinivasan, Gette, Cody R., Swenson, Orven F., Hobbie, Erik K. (2014) Structural and electronic characterization of 355 nm laser-crystallized silicon: Interplay of film thickness and laser fluence. Journal of Applied Physics, 115 (16). 163503pp. doi:10.1063/1.4872464 | ||
| Plain Text | Semler, Matthew R., Hoey, Justin M., Guruvenket, Srinivasan, Gette, Cody R., Swenson, Orven F., Hobbie, Erik K. (2014) Structural and electronic characterization of 355 nm laser-crystallized silicon: Interplay of film thickness and laser fluence. Journal of Applied Physics, 115 (16). 163503pp. doi:10.1063/1.4872464 | ||
| In | (2014, April) Journal of Applied Physics Vol. 115 (16) AIP Publishing | ||
See Also
These are possibly similar items as determined by title/reference text matching only.
