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Wang, Yi-zhen, Chen, Lan, Wang, Hai-yan, Frank Zhang, X., Fu, Jun, Xiong, Xiao-min, Zhang, Jin-xiu (2014) Development of “fragility” in relaxor ferroelectrics. Journal of Applied Physics, 115 (5). 54106pp. doi:10.1063/1.4864256

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Reference TypeJournal (article/letter/editorial)
TitleDevelopment of “fragility” in relaxor ferroelectrics
JournalJournal of Applied Physics
AuthorsWang, Yi-zhenAuthor
Chen, LanAuthor
Wang, Hai-yanAuthor
Frank Zhang, X.Author
Fu, JunAuthor
Xiong, Xiao-minAuthor
Zhang, Jin-xiuAuthor
Year2014 (February 7)Volume115
Issue5
PublisherAIP Publishing
DOIdoi:10.1063/1.4864256Search in ResearchGate
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Mindat Ref. ID5198322Long-form Identifiermindat:1:5:5198322:2
GUID0
Full ReferenceWang, Yi-zhen, Chen, Lan, Wang, Hai-yan, Frank Zhang, X., Fu, Jun, Xiong, Xiao-min, Zhang, Jin-xiu (2014) Development of “fragility” in relaxor ferroelectrics. Journal of Applied Physics, 115 (5). 54106pp. doi:10.1063/1.4864256
Plain TextWang, Yi-zhen, Chen, Lan, Wang, Hai-yan, Frank Zhang, X., Fu, Jun, Xiong, Xiao-min, Zhang, Jin-xiu (2014) Development of “fragility” in relaxor ferroelectrics. Journal of Applied Physics, 115 (5). 54106pp. doi:10.1063/1.4864256
In(2014, February) Journal of Applied Physics Vol. 115 (5) AIP Publishing

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