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Ureña, Ferran, Olsen, Sarah H., Escobedo-Cousin, Enrique, Minamisawa, Renato A., Raskin, Jean-Pierre (2014) Roughness analysis in strained silicon-on-insulator wires and films. Journal of Applied Physics, 116 (12). 124503pp. doi:10.1063/1.4896301

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Reference TypeJournal (article/letter/editorial)
TitleRoughness analysis in strained silicon-on-insulator wires and films
JournalJournal of Applied Physics
AuthorsUreña, FerranAuthor
Olsen, Sarah H.Author
Escobedo-Cousin, EnriqueAuthor
Minamisawa, Renato A.Author
Raskin, Jean-PierreAuthor
Year2014 (September 28)Volume116
Issue12
PublisherAIP Publishing
DOIdoi:10.1063/1.4896301Search in ResearchGate
Generate Citation Formats
Mindat Ref. ID5198895Long-form Identifiermindat:1:5:5198895:3
GUID0
Full ReferenceUreña, Ferran, Olsen, Sarah H., Escobedo-Cousin, Enrique, Minamisawa, Renato A., Raskin, Jean-Pierre (2014) Roughness analysis in strained silicon-on-insulator wires and films. Journal of Applied Physics, 116 (12). 124503pp. doi:10.1063/1.4896301
Plain TextUreña, Ferran, Olsen, Sarah H., Escobedo-Cousin, Enrique, Minamisawa, Renato A., Raskin, Jean-Pierre (2014) Roughness analysis in strained silicon-on-insulator wires and films. Journal of Applied Physics, 116 (12). 124503pp. doi:10.1063/1.4896301
In(2014, September) Journal of Applied Physics Vol. 116 (12) AIP Publishing

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Ureña, Ferran, Olsen, Sarah H., Raskin, Jean-Pierre (2013) Raman measurements of uniaxial strain in silicon nanostructures. Journal of Applied Physics, 114 (14). 144507pp. doi:10.1063/1.4824291
Ureña, Ferran, Olsen, Sarah H., Šiller, Lidija, Bhaskar, Umesh, Pardoen, Thomas, Raskin, Jean-Pierre (2012) Strain in silicon nanowire beams. Journal of Applied Physics, 112 (11). 114506pp. doi:10.1063/1.4765025
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Escobedo-Cousin, E., Olsen, S. H., Pardoen, T., Bhaskar, U., Raskin, J.-P. (2011) Experimental observations of surface roughness in uniaxially loaded strained Si microelectromechanical systems-based structures. Applied Physics Letters, 99 (24). 241906pp. doi:10.1063/1.3669413
Ureña-Begara, Ferran, Vayrette, Renaud, Bhaskar, Umesh Kumar, Raskin, Jean-Pierre (2018) Raman analysis of strain in p-type doped silicon nanostructures. Journal of Applied Physics, 124 (9). 95102pp. doi:10.1063/1.5045736
Ureña-Begara, Ferran, Crunteanu, Aurelian, Raskin, Jean-Pierre (2017) Raman and XPS characterization of vanadium oxide thin films with temperature. Applied Surface Science, 403. 717-727 doi:10.1016/j.apsusc.2017.01.160
Yan, L., Olsen, S. H., Escobedo-Cousin, E., O’Neill, A. G. (2008) Improved gate oxide integrity of strained Si n-channel metal oxide silicon field effect transistors using thin virtual substrates. Journal of Applied Physics, 103 (9). 94508pp. doi:10.1063/1.2917286
Kumar Bhaskar, Umesh, Pardoen, Thomas, Passi, Vikram, Raskin, Jean-Pierre (2013) Surface states and conductivity of silicon nano-wires. Journal of Applied Physics, 113 (13). 134502pp. doi:10.1063/1.4798611
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Escobedo-Cousin, E, Olsen, S H, O'Neill, A G, Coulson, H (2009) Defect identification in strained Si/SiGe heterolayers for device applications. Journal of Physics D: Applied Physics, 42. 175306pp. doi:10.1088/0022-3727/42/17/175306
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