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Maaß, H., Schreyeck, S., Schatz, S., Fiedler, S., Seibel, C., Lutz, P., Karczewski, G., Bentmann, H., Gould, C., Brunner, K., Molenkamp, L. W., Reinert, F. (2014) Electronic structure and morphology of epitaxial Bi2Te2Se topological insulator films. Journal of Applied Physics, 116 (19). 193708pp. doi:10.1063/1.4902010

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Reference TypeJournal (article/letter/editorial)
TitleElectronic structure and morphology of epitaxial Bi2Te2Se topological insulator films
JournalJournal of Applied Physics
AuthorsMaaß, H.Author
Schreyeck, S.Author
Schatz, S.Author
Fiedler, S.Author
Seibel, C.Author
Lutz, P.Author
Karczewski, G.Author
Bentmann, H.Author
Gould, C.Author
Brunner, K.Author
Molenkamp, L. W.Author
Reinert, F.Author
Year2014 (November 21)Volume116
Issue19
PublisherAIP Publishing
DOIdoi:10.1063/1.4902010Search in ResearchGate
Generate Citation Formats
Mindat Ref. ID5199418Long-form Identifiermindat:1:5:5199418:5
GUID0
Full ReferenceMaaß, H., Schreyeck, S., Schatz, S., Fiedler, S., Seibel, C., Lutz, P., Karczewski, G., Bentmann, H., Gould, C., Brunner, K., Molenkamp, L. W., Reinert, F. (2014) Electronic structure and morphology of epitaxial Bi2Te2Se topological insulator films. Journal of Applied Physics, 116 (19). 193708pp. doi:10.1063/1.4902010
Plain TextMaaß, H., Schreyeck, S., Schatz, S., Fiedler, S., Seibel, C., Lutz, P., Karczewski, G., Bentmann, H., Gould, C., Brunner, K., Molenkamp, L. W., Reinert, F. (2014) Electronic structure and morphology of epitaxial Bi2Te2Se topological insulator films. Journal of Applied Physics, 116 (19). 193708pp. doi:10.1063/1.4902010
In(2014, November) Journal of Applied Physics Vol. 116 (19) AIP Publishing

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