Nikolova, Liliya, Stern, Mark J., MacLeod, Jennifer M., Reed, Bryan W., Ibrahim, Heide, Campbell, Geoffrey H., Rosei, Federico, LaGrange, Thomas, Siwick, Bradley J. (2014) In situinvestigation of explosive crystallization in a-Ge: Experimental determination of the interface response function using dynamic transmission electron microscopy. Journal of Applied Physics, 116 (9). 93512pp. doi:10.1063/1.4894397
| Reference Type | Journal (article/letter/editorial) | ||
|---|---|---|---|
| Title | In situinvestigation of explosive crystallization in a-Ge: Experimental determination of the interface response function using dynamic transmission electron microscopy | ||
| Journal | Journal of Applied Physics | ||
| Authors | Nikolova, Liliya | Author | |
| Stern, Mark J. | Author | ||
| MacLeod, Jennifer M. | Author | ||
| Reed, Bryan W. | Author | ||
| Ibrahim, Heide | Author | ||
| Campbell, Geoffrey H. | Author | ||
| Rosei, Federico | Author | ||
| LaGrange, Thomas | Author | ||
| Siwick, Bradley J. | Author | ||
| Year | 2014 (September 7) | Volume | 116 |
| Issue | 9 | ||
| Publisher | AIP Publishing | ||
| DOI | doi:10.1063/1.4894397Search in ResearchGate | ||
| Generate Citation Formats | |||
| Mindat Ref. ID | 5200415 | Long-form Identifier | mindat:1:5:5200415:1 |
| GUID | 0 | ||
| Full Reference | Nikolova, Liliya, Stern, Mark J., MacLeod, Jennifer M., Reed, Bryan W., Ibrahim, Heide, Campbell, Geoffrey H., Rosei, Federico, LaGrange, Thomas, Siwick, Bradley J. (2014) In situinvestigation of explosive crystallization in a-Ge: Experimental determination of the interface response function using dynamic transmission electron microscopy. Journal of Applied Physics, 116 (9). 93512pp. doi:10.1063/1.4894397 | ||
| Plain Text | Nikolova, Liliya, Stern, Mark J., MacLeod, Jennifer M., Reed, Bryan W., Ibrahim, Heide, Campbell, Geoffrey H., Rosei, Federico, LaGrange, Thomas, Siwick, Bradley J. (2014) In situinvestigation of explosive crystallization in a-Ge: Experimental determination of the interface response function using dynamic transmission electron microscopy. Journal of Applied Physics, 116 (9). 93512pp. doi:10.1063/1.4894397 | ||
| In | (2014, September) Journal of Applied Physics Vol. 116 (9) AIP Publishing | ||
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