Heidary, Damoon Sohrabi Baba, Qu, Weiguo, Randall, Clive A. (2015) Electrical characterization and analysis of the degradation of electrode Schottky barriers in BaTiO3 dielectric materials due to hydrogen exposure. Journal of Applied Physics, 117 (12). 124104pp. doi:10.1063/1.4915937
| Reference Type | Journal (article/letter/editorial) | ||
|---|---|---|---|
| Title | Electrical characterization and analysis of the degradation of electrode Schottky barriers in BaTiO3 dielectric materials due to hydrogen exposure | ||
| Journal | Journal of Applied Physics | ||
| Authors | Heidary, Damoon Sohrabi Baba | Author | |
| Qu, Weiguo | Author | ||
| Randall, Clive A. | Author | ||
| Year | 2015 (March 28) | Volume | 117 |
| Issue | 12 | ||
| Publisher | AIP Publishing | ||
| DOI | doi:10.1063/1.4915937Search in ResearchGate | ||
| Generate Citation Formats | |||
| Mindat Ref. ID | 5200703 | Long-form Identifier | mindat:1:5:5200703:3 |
| GUID | 0 | ||
| Full Reference | Heidary, Damoon Sohrabi Baba, Qu, Weiguo, Randall, Clive A. (2015) Electrical characterization and analysis of the degradation of electrode Schottky barriers in BaTiO3 dielectric materials due to hydrogen exposure. Journal of Applied Physics, 117 (12). 124104pp. doi:10.1063/1.4915937 | ||
| Plain Text | Heidary, Damoon Sohrabi Baba, Qu, Weiguo, Randall, Clive A. (2015) Electrical characterization and analysis of the degradation of electrode Schottky barriers in BaTiO3 dielectric materials due to hydrogen exposure. Journal of Applied Physics, 117 (12). 124104pp. doi:10.1063/1.4915937 | ||
| In | (2015, March) Journal of Applied Physics Vol. 117 (12) AIP Publishing | ||
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