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Iskandar, A., Abou-Khalil, A., Kazan, M., Kassem, W., Volz, S. (2015) On the interplay between phonon-boundary scattering and phonon-point-defect scattering in SiGe thin films. Journal of Applied Physics, 117 (12). 125102pp. doi:10.1063/1.4915948

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Reference TypeJournal (article/letter/editorial)
TitleOn the interplay between phonon-boundary scattering and phonon-point-defect scattering in SiGe thin films
JournalJournal of Applied Physics
AuthorsIskandar, A.Author
Abou-Khalil, A.Author
Kazan, M.Author
Kassem, W.Author
Volz, S.Author
Year2015 (March 28)Volume117
Issue12
PublisherAIP Publishing
DOIdoi:10.1063/1.4915948Search in ResearchGate
Generate Citation Formats
Mindat Ref. ID5200708Long-form Identifiermindat:1:5:5200708:8
GUID0
Full ReferenceIskandar, A., Abou-Khalil, A., Kazan, M., Kassem, W., Volz, S. (2015) On the interplay between phonon-boundary scattering and phonon-point-defect scattering in SiGe thin films. Journal of Applied Physics, 117 (12). 125102pp. doi:10.1063/1.4915948
Plain TextIskandar, A., Abou-Khalil, A., Kazan, M., Kassem, W., Volz, S. (2015) On the interplay between phonon-boundary scattering and phonon-point-defect scattering in SiGe thin films. Journal of Applied Physics, 117 (12). 125102pp. doi:10.1063/1.4915948
In(2015, March) Journal of Applied Physics Vol. 117 (12) AIP Publishing

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