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Ma, Chengfu, Chen, Yuhang, Arnold, Walter, Chu, Jiaru (2017) Detection of subsurface cavity structures using contact-resonance atomic force microscopy. Journal of Applied Physics, 121 (15). 154301pp. doi:10.1063/1.4981537

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Reference TypeJournal (article/letter/editorial)
TitleDetection of subsurface cavity structures using contact-resonance atomic force microscopy
JournalJournal of Applied Physics
AuthorsMa, ChengfuAuthor
Chen, YuhangAuthor
Arnold, WalterAuthor
Chu, JiaruAuthor
Year2017 (April 21)Volume121
Issue15
PublisherAIP Publishing
DOIdoi:10.1063/1.4981537Search in ResearchGate
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Mindat Ref. ID5206568Long-form Identifiermindat:1:5:5206568:4
GUID0
Full ReferenceMa, Chengfu, Chen, Yuhang, Arnold, Walter, Chu, Jiaru (2017) Detection of subsurface cavity structures using contact-resonance atomic force microscopy. Journal of Applied Physics, 121 (15). 154301pp. doi:10.1063/1.4981537
Plain TextMa, Chengfu, Chen, Yuhang, Arnold, Walter, Chu, Jiaru (2017) Detection of subsurface cavity structures using contact-resonance atomic force microscopy. Journal of Applied Physics, 121 (15). 154301pp. doi:10.1063/1.4981537
In(2017, April) Journal of Applied Physics Vol. 121 (15) AIP Publishing

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Ma, Chengfu, Zhou, Chenggang, Peng, Jinlan, Chen, Yuhang, Arnold, Walter, Chu, Jiaru (2021) Thermal noise in contact atomic force microscopy. Journal of Applied Physics, 129 (23) 234303pp. doi:10.1063/5.0054256
Wang, Tian, Ma, Chengfu, Hu, Wei, Chen, Yuhang, Chu, Jiaru (2017) Visualizing subsurface defects in graphite by acoustic atomic force microscopy. Microscopy Research and Technique, 80 (1). 66-74 doi:10.1002/jemt.22668
Ma, Chengfu, Arnold, Walter (2020) Nanoscale ultrasonic subsurface imaging with atomic force microscopy. Journal of Applied Physics, 128 (18) 180901pp. doi:10.1063/5.0019042
Wang, Wenting, Ma, Chengfu, Chen, Yuhang (2020) Measurement of undercut etching by contact resonance atomic force microscopy. Applied Physics Letters, 117 (2) 23103pp. doi:10.1063/5.0013479
Ma, Chengfu, Chen, Yuhang, Wang, Tian, Chu, Jiaru (2015) Atomic force microscopy force-distance curves with small amplitude ultrasonic modulation. Scanning, 37 (4). 284-293 doi:10.1002/sca.21211
Wang, Tian, Ma, Chengfu, Chen, Yuhang, Chu, Jiaru, Huang, Wenhao (2015) Effects of temperature and humidity on atomic force microscopy dimensional measurement. Microscopy Research and Technique, 78 (7). 562-568 doi:10.1002/jemt.22509
Hu, Shuiqing, Su, Chanmin, Arnold, Walter (2011) Imaging of subsurface structures using atomic force acoustic microscopy at GHz frequencies. Journal of Applied Physics, 109 (8). 84324pp. doi:10.1063/1.3573484
Zhang, Weijie, Chen, Yuhang, Chu, Jiaru (2017) Note: Double-hole cantilevers for harmonic atomic force microscopy. Review of Scientific Instruments, 88 (10). 106101pp. doi:10.1063/1.4991073
Wang, Wenting, Zhang, Wenhao, Chen, Yuhang (2020) Enhancement of contact resonance atomic force microscopy subsurface imaging by mass-attached cantilevers. Journal of Physics D: Applied Physics, 53. 215301pp. doi:10.1088/1361-6463/ab7961
Ma, C., Pfahl, V., Wang, Z., Chen, Y., Chu, J., Phani, M. K., Kumar, A., Arnold, W., Samwer, K. (2018) Stick-to-sliding transition in contact-resonance atomic force microscopy. Applied Physics Letters, 113 (8). 83102pp. doi:10.1063/1.5036975
Ma, Chengfu, Chen, Yuhang, Chu, Jiaru (2023) Time-Dependent Pinning of Nanoblisters Confined by Two-Dimensional Sheets. Part 2: Contact Line Pinning. Langmuir, 39 (2) 709-716 doi:10.1021/acs.langmuir.2c03318
 
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