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Isomura, Noritake, Cui, Yi-Tao, Murai, Takaaki, Oji, Hiroshi, Kimoto, Yasuji (2017) X-ray absorption spectroscopy to determine originating depth of electrons that form an inelastic background of Auger electron spectrum. Journal of Applied Physics, 122 (2). 25307pp. doi:10.1063/1.4994025

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Reference TypeJournal (article/letter/editorial)
TitleX-ray absorption spectroscopy to determine originating depth of electrons that form an inelastic background of Auger electron spectrum
JournalJournal of Applied Physics
AuthorsIsomura, NoritakeAuthor
Cui, Yi-TaoAuthor
Murai, TakaakiAuthor
Oji, HiroshiAuthor
Kimoto, YasujiAuthor
Year2017 (July 14)Volume122
Issue2
PublisherAIP Publishing
DOIdoi:10.1063/1.4994025Search in ResearchGate
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Mindat Ref. ID5207921Long-form Identifiermindat:1:5:5207921:6
GUID0
Full ReferenceIsomura, Noritake, Cui, Yi-Tao, Murai, Takaaki, Oji, Hiroshi, Kimoto, Yasuji (2017) X-ray absorption spectroscopy to determine originating depth of electrons that form an inelastic background of Auger electron spectrum. Journal of Applied Physics, 122 (2). 25307pp. doi:10.1063/1.4994025
Plain TextIsomura, Noritake, Cui, Yi-Tao, Murai, Takaaki, Oji, Hiroshi, Kimoto, Yasuji (2017) X-ray absorption spectroscopy to determine originating depth of electrons that form an inelastic background of Auger electron spectrum. Journal of Applied Physics, 122 (2). 25307pp. doi:10.1063/1.4994025
In(2017, July) Journal of Applied Physics Vol. 122 (2) AIP Publishing

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Isomura, Noritake, Murai, Takaaki, Oji, Hiroshi, Nomoto, Toyokazu, Watanabe, Yukihiko, Kimoto, Yasuji (2017) Chemical-state-selective X-ray absorption spectroscopy by detecting bond-specific Auger electrons for SiO2/SiC interface. Japanese Journal of Applied Physics, 56 (8) 81301 doi:10.7567/jjap.56.081301
Isomura, Noritake, Soejima, Narumasa, Iwasaki, Shiro, Nomoto, Toyokazu, Murai, Takaaki, Kimoto, Yasuji (2015) Depth-selective X-ray absorption spectroscopy by detection of energy-loss Auger electrons. Applied Surface Science, 355. 268-271 doi:10.1016/j.apsusc.2015.07.110
Isomura, Noritake, Murai, Takaaki, Nomoto, Toyokazu, Kimoto, Yasuji (2017) Surface EXAFS via differential electron yield. Journal of Synchrotron Radiation, 24 (2). 445-448 doi:10.1107/s1600577516019676
Isomura, Noritake, Oh-ishi, Keiichiro, Takahashi, Naoko, Kosaka, Satoru (2022) Depth-resolved analysis of local atomic structures via X-ray absorption spectroscopy through the detection of energy-loss Auger electrons. Applied Surface Science, 575. 151610pp. doi:10.1016/j.apsusc.2021.151610
Isomura, Noritake, Kosaka, Satoru, Kataoka, Keita, Watanabe, Yukihiko, Kimoto, Yasuji (2018) X-ray absorption spectroscopy study on SiC-side interface structure of SiO2–SiC formed by thermal oxidation in dry oxygen. Japanese Journal of Applied Physics, 57 (6) 60308 doi:10.7567/jjap.57.060308
Isomura, Noritake, Kataoka, Keita, Watanabe, Yukihiko, Kimoto, Yasuji (2019) Distinguishing nitrogen-containing sites in the m face of 4H-SiC after nitric oxide annealing by X-ray absorption spectroscopy. Japanese Journal of Applied Physics, 58 (5) 51007 doi:10.7567/1347-4065/ab0a25
Isomura, Noritake, Kutsuki, Katsuhiro, Kataoka, Keita, Watanabe, Yukihiko, Kimoto, Yasuji (2019) Distinguishing nitrogen-containing sites in SiO2/4H-SiC(0001) after nitric oxide annealing by X-ray absorption spectroscopy. Journal of Synchrotron Radiation, 26 (2). 462-466 doi:10.1107/s1600577519001504
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