Reference Type | Journal (article/letter/editorial) |
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Title | Anisotropic index of refraction and structural properties of hexagonal boron nitride epilayers probed by spectroscopic ellipsometry |
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Journal | Journal of Applied Physics |
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Authors | McKay, M. A. | Author |
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Li, J. | Author |
Lin, J. Y. | Author |
Jiang, H. X. | Author |
Year | 2020 (February 7) | Volume | 127 |
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Issue | 5 |
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Publisher | AIP Publishing |
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DOI | doi:10.1063/1.5134908Search in ResearchGate |
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| Generate Citation Formats |
Mindat Ref. ID | 5213090 | Long-form Identifier | mindat:1:5:5213090:6 |
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GUID | 0 |
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Full Reference | McKay, M. A., Li, J., Lin, J. Y., Jiang, H. X. (2020) Anisotropic index of refraction and structural properties of hexagonal boron nitride epilayers probed by spectroscopic ellipsometry. Journal of Applied Physics, 127 (5). 53103pp. doi:10.1063/1.5134908 |
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Plain Text | McKay, M. A., Li, J., Lin, J. Y., Jiang, H. X. (2020) Anisotropic index of refraction and structural properties of hexagonal boron nitride epilayers probed by spectroscopic ellipsometry. Journal of Applied Physics, 127 (5). 53103pp. doi:10.1063/1.5134908 |
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In | (2020, February) Journal of Applied Physics Vol. 127 (5) AIP Publishing |
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