Lonsdale, Kathleen (1948) Note on quantitative analysis by x-ray diffraction methods. American Mineralogist, 33 (1-2) 90-93

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Reference Type	Journal (article/letter/editorial)
Title	Note on quantitative analysis by x-ray diffraction methods
Journal	American Mineralogist
Authors	Lonsdale, Kathleen		Author
Year	1948	Volume	33
Issue	1-2
Publisher	Mineralogical Society of America
Download URL	http://www.minsocam.org/ammin/AM33/AM33_90.pdf +
Mindat Ref. ID	521753	Long-form Identifier	mindat:1:5:521753:7
GUID	0
Full Reference	Lonsdale, Kathleen (1948) Note on quantitative analysis by x-ray diffraction methods. American Mineralogist, 33 (1-2) 90-93
Plain Text	Lonsdale, Kathleen (1948) Note on quantitative analysis by x-ray diffraction methods. American Mineralogist, 33 (1-2) 90-93
In	(1948) American Mineralogist Vol. 33 (1-2) Mineralogical Society of America

	*Carl, Howard F. (1948) Notes and news: Notes on the reliability of the x-ray diffraction spectrometer for quantitative mineral analysis. American Mineralogist, 33 (9-10) 645-647*
	*LONSDALE, KATHLEEN (1948) X-Ray Scattering by Thermal Vibrations in Crystals. Nature, 162 (4110). 216 doi:10.1038/162216a0*
	*Lonsdale, Kathleen (1971) MINERALOGICAL NOTES. American Mineralogist, 56 (1-2) 333-335*
	*Schoen, Robert (1962) Semi-quantitative analysis of chlorites by x-ray diffraction. American Mineralogist, 47 (11-12) 1384-1392*
	*LONSDALE, KATHLEEN (1971) X-Ray Diffraction. Nature, 233 (5320). 506 doi:10.1038/233506a0*
	*Wickman, Frans E. (1948) Note on schirmerite. American Mineralogist, 33 (3-4) 262*
	*Carl, Howard F. (1947) Quantitative mineral analysis with a recording x-ray diffraction spectrometer. American Mineralogist, 32 (9-10) 508-517*
	*Popović, Stanko (2020) Quantitative Phase Analysis by X-ray Diffraction—Doping Methods and Applications. Crystals, 10 (1) 27 doi:10.3390/cryst10010027*
	*(1986) Quantitative Analysis of Sedimentary Minerals by Powder X-ray Diffraction. Powder Diffraction, 1 (2) 37-39 doi:10.1017/s0885715600011556*
	*(1987) Quantitative Phase Analysis By Linear Regression of Chemistry on X-Ray Diffraction Intensity. Powder Diffraction, 2 (2) 96-98 doi:10.1017/s0885715600012458*
	*(2004) Quantitative analysis by X-ray induced total electron yield (TEY) compared to XRFA. Powder Diffraction, 19 (1) 90-96 doi:10.1154/1.1649329*

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Lonsdale, Kathleen (1948) Note on quantitative analysis by x-ray diffraction methods. American Mineralogist, 33 (1-2) 90-93

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