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McGilvery, C M, McComb, D W, MacKenzie, M, Craven, A J, McFadzean, S, Gendt, S D (2008) Analysis of hafnium containing powders and thin films for CMOS device applications. Journal of Physics: Conference Series, 126. 12003pp. doi:10.1088/1742-6596/126/1/012003

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Reference TypeJournal (article/letter/editorial)
TitleAnalysis of hafnium containing powders and thin films for CMOS device applications
JournalJournal of Physics: Conference Series
AuthorsMcGilvery, C MAuthor
McComb, D WAuthor
MacKenzie, MAuthor
Craven, A JAuthor
McFadzean, SAuthor
Gendt, S DAuthor
Year2008 (August 1)Volume126
PublisherIOP Publishing
DOIdoi:10.1088/1742-6596/126/1/012003Search in ResearchGate
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Mindat Ref. ID5222023Long-form Identifiermindat:1:5:5222023:6
GUID0
Full ReferenceMcGilvery, C M, McComb, D W, MacKenzie, M, Craven, A J, McFadzean, S, Gendt, S D (2008) Analysis of hafnium containing powders and thin films for CMOS device applications. Journal of Physics: Conference Series, 126. 12003pp. doi:10.1088/1742-6596/126/1/012003
Plain TextMcGilvery, C M, McComb, D W, MacKenzie, M, Craven, A J, McFadzean, S, Gendt, S D (2008) Analysis of hafnium containing powders and thin films for CMOS device applications. Journal of Physics: Conference Series, 126. 12003pp. doi:10.1088/1742-6596/126/1/012003
In(2008) Journal of Physics: Conference Series Vol. 126. IOP Publishing

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McGilvery, Catriona M., De Gendt, Stefan, Payzant, E. Andrew, MacKenzie, Maureen, Craven, Alan J., McComb, David W. (2012) Investigation of Crystallization Processes from Hafnium Silicate Powders Prepared from an Oxychloride Sol-Gel. Journal of the American Ceramic Society, 95 (12). 3985-3991 doi:10.1111/j.1551-2916.2012.05408.x
 
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