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Walther, T (2008) A comparison of transmission electron microscopy methods to measure wetting layer thicknesses to sub-monolayer precision. Journal of Physics: Conference Series, 126. 12091pp. doi:10.1088/1742-6596/126/1/012091

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Reference TypeJournal (article/letter/editorial)
TitleA comparison of transmission electron microscopy methods to measure wetting layer thicknesses to sub-monolayer precision
JournalJournal of Physics: Conference Series
AuthorsWalther, TAuthor
Year2008 (August 1)Volume126
PublisherIOP Publishing
DOIdoi:10.1088/1742-6596/126/1/012091Search in ResearchGate
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Mindat Ref. ID5222110Long-form Identifiermindat:1:5:5222110:1
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Full ReferenceWalther, T (2008) A comparison of transmission electron microscopy methods to measure wetting layer thicknesses to sub-monolayer precision. Journal of Physics: Conference Series, 126. 12091pp. doi:10.1088/1742-6596/126/1/012091
Plain TextWalther, T (2008) A comparison of transmission electron microscopy methods to measure wetting layer thicknesses to sub-monolayer precision. Journal of Physics: Conference Series, 126. 12091pp. doi:10.1088/1742-6596/126/1/012091
In(2008) Journal of Physics: Conference Series Vol. 126. IOP Publishing

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