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Liu, Lijia, Murphy, M, Ko, J Y P, Sham, T K (2009) XAFS studies of Pt nanoparticles deposition on Si nanowires. Journal of Physics: Conference Series, 190. 12133pp. doi:10.1088/1742-6596/190/1/012133

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Reference TypeJournal (article/letter/editorial)
TitleXAFS studies of Pt nanoparticles deposition on Si nanowires
JournalJournal of Physics: Conference Series
AuthorsLiu, LijiaAuthor
Murphy, MAuthor
Ko, J Y PAuthor
Sham, T KAuthor
Year2009 (November 1)Volume190
PublisherIOP Publishing
DOIdoi:10.1088/1742-6596/190/1/012133Search in ResearchGate
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Mindat Ref. ID5226616Long-form Identifiermindat:1:5:5226616:8
GUID0
Full ReferenceLiu, Lijia, Murphy, M, Ko, J Y P, Sham, T K (2009) XAFS studies of Pt nanoparticles deposition on Si nanowires. Journal of Physics: Conference Series, 190. 12133pp. doi:10.1088/1742-6596/190/1/012133
Plain TextLiu, Lijia, Murphy, M, Ko, J Y P, Sham, T K (2009) XAFS studies of Pt nanoparticles deposition on Si nanowires. Journal of Physics: Conference Series, 190. 12133pp. doi:10.1088/1742-6596/190/1/012133
In(2009) Journal of Physics: Conference Series Vol. 190. IOP Publishing

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Ichikuni, N, Wakai, Y, Hara, T, Shimazu, S (2009) Nb and Fe K-edges XAFS study on the structure of supported Fe-NbN catalysts. Journal of Physics: Conference Series, 190. 12169pp. doi:10.1088/1742-6596/190/1/012169
Hayashi, H, Kawamura, N, Mizumaki, M, Takabatake, T, Imura, H, Okamoto, K, Akai, T (2009) Valence-selective XAFS spectroscopy using EuLγ4emission. Journal of Physics: Conference Series, 190. 12050pp. doi:10.1088/1742-6596/190/1/012050
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Ofuchi, H, Ishikawa, K, Zhang, K, Kuroda, S, Mitome, M, Bando, Y (2009) Fluorescence XAFS analysis of local structures in iodine-doped Zn1-xCrxTe. Journal of Physics: Conference Series, 190. 12103pp. doi:10.1088/1742-6596/190/1/012103
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Ofuchi, H, Toyoda, S, Ikeda, K, Liu, G L, Liu, Z, Oshima, M (2009) Fluorescence XAFS study of local structures in high-k gate dielectrics HfSiON/SiON/Si annealed at various nitrogen gas partial pressure. Journal of Physics: Conference Series, 190. 12116pp. doi:10.1088/1742-6596/190/1/012116
 
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