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Khan, Jakeer, Selvakumar, N, Chowdhury, Prasanta, Barshilia, Harish C (2012) Indigenous development of ultra high vacuum (UHV) magnetron sputtering system for the preparation of Permalloy magnetic thin films. Journal of Physics: Conference Series, 390. 12081pp. doi:10.1088/1742-6596/390/1/012081

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Reference TypeJournal (article/letter/editorial)
TitleIndigenous development of ultra high vacuum (UHV) magnetron sputtering system for the preparation of Permalloy magnetic thin films
JournalJournal of Physics: Conference Series
AuthorsKhan, JakeerAuthor
Selvakumar, NAuthor
Chowdhury, PrasantaAuthor
Barshilia, Harish CAuthor
Year2012 (November 5)Volume390
PublisherIOP Publishing
DOIdoi:10.1088/1742-6596/390/1/012081Search in ResearchGate
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Mindat Ref. ID5240889Long-form Identifiermindat:1:5:5240889:8
GUID0
Full ReferenceKhan, Jakeer, Selvakumar, N, Chowdhury, Prasanta, Barshilia, Harish C (2012) Indigenous development of ultra high vacuum (UHV) magnetron sputtering system for the preparation of Permalloy magnetic thin films. Journal of Physics: Conference Series, 390. 12081pp. doi:10.1088/1742-6596/390/1/012081
Plain TextKhan, Jakeer, Selvakumar, N, Chowdhury, Prasanta, Barshilia, Harish C (2012) Indigenous development of ultra high vacuum (UHV) magnetron sputtering system for the preparation of Permalloy magnetic thin films. Journal of Physics: Conference Series, 390. 12081pp. doi:10.1088/1742-6596/390/1/012081
In(2012) Journal of Physics: Conference Series Vol. 390. IOP Publishing

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Kondaiah, P, Rao, G Mohan, Uthanna, S (2012) Preparation of magnetron sputtered ZrO2films on Si for gate dielectric application. Journal of Physics: Conference Series, 390. 12031pp. doi:10.1088/1742-6596/390/1/012031
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Sreevidya, P.V., Khan, Jakeer, Barshilia, Harish C., Ananda, C.M., Chowdhury, P. (2018) Development of two axes magnetometer for navigation applications. Journal of Magnetism and Magnetic Materials, 448. 298-302 doi:10.1016/j.jmmm.2017.08.064
Khan, M S, Swamy, Rajamannar, Khirwadkar, S S, , (2012) Conceptual Design of Vacuum Chamber for testing of high heat flux components using electron beam as a source. Journal of Physics: Conference Series, 390. 12060pp. doi:10.1088/1742-6596/390/1/012060
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