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Lee, J. S., Lim, H. B. (2011) Laser ablation ICP-MS to determine Cu on a Si wafer prepared by ion sputtering. Journal of Analytical Atomic Spectrometry, 26 (7). 1534pp. doi:10.1039/c0ja00143k

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Reference TypeJournal (article/letter/editorial)
TitleLaser ablation ICP-MS to determine Cu on a Si wafer prepared by ion sputtering
JournalJournal of Analytical Atomic Spectrometry
AuthorsLee, J. S.Author
Lim, H. B.Author
Year2011Volume26
Issue7
PublisherRoyal Society of Chemistry (RSC)
DOIdoi:10.1039/c0ja00143kSearch in ResearchGate
Generate Citation Formats
Mindat Ref. ID5341346Long-form Identifiermindat:1:5:5341346:2
GUID0
Full ReferenceLee, J. S., Lim, H. B. (2011) Laser ablation ICP-MS to determine Cu on a Si wafer prepared by ion sputtering. Journal of Analytical Atomic Spectrometry, 26 (7). 1534pp. doi:10.1039/c0ja00143k
Plain TextLee, J. S., Lim, H. B. (2011) Laser ablation ICP-MS to determine Cu on a Si wafer prepared by ion sputtering. Journal of Analytical Atomic Spectrometry, 26 (7). 1534pp. doi:10.1039/c0ja00143k
In(2011) Journal of Analytical Atomic Spectrometry Vol. 26 (7) Royal Society of Chemistry (RSC)

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Prohaska, T., Irrgeher, J., Zitek, A. (2016) Simultaneous multi-element and isotope ratio imaging of fish otoliths by laser ablation split stream ICP-MS/MC ICP-MS. Journal of Analytical Atomic Spectrometry, 31 (8). 1612-1621 doi:10.1039/c6ja00087h
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