Buzanich, Günter, Radtke, Martin, Reinholz, Uwe, Riesemeier, Heinrich, Thünemann, Andreas F., Streli, Christina (2012) Impurities in multicrystalline silicon wafers for solar cells detected by synchrotron micro-beam X-ray fluorescence analysis. Journal of Analytical Atomic Spectrometry, 27 (11). 1875pp. doi:10.1039/c2ja30188a
| Reference Type | Journal (article/letter/editorial) | ||
|---|---|---|---|
| Title | Impurities in multicrystalline silicon wafers for solar cells detected by synchrotron micro-beam X-ray fluorescence analysis | ||
| Journal | Journal of Analytical Atomic Spectrometry | ||
| Authors | Buzanich, Günter | Author | |
| Radtke, Martin | Author | ||
| Reinholz, Uwe | Author | ||
| Riesemeier, Heinrich | Author | ||
| Thünemann, Andreas F. | Author | ||
| Streli, Christina | Author | ||
| Year | 2012 | Volume | 27 |
| Issue | 11 | ||
| Publisher | Royal Society of Chemistry (RSC) | ||
| DOI | doi:10.1039/c2ja30188aSearch in ResearchGate | ||
| Generate Citation Formats | |||
| Mindat Ref. ID | 5341644 | Long-form Identifier | mindat:1:5:5341644:1 |
| GUID | 0 | ||
| Full Reference | Buzanich, Günter, Radtke, Martin, Reinholz, Uwe, Riesemeier, Heinrich, Thünemann, Andreas F., Streli, Christina (2012) Impurities in multicrystalline silicon wafers for solar cells detected by synchrotron micro-beam X-ray fluorescence analysis. Journal of Analytical Atomic Spectrometry, 27 (11). 1875pp. doi:10.1039/c2ja30188a | ||
| Plain Text | Buzanich, Günter, Radtke, Martin, Reinholz, Uwe, Riesemeier, Heinrich, Thünemann, Andreas F., Streli, Christina (2012) Impurities in multicrystalline silicon wafers for solar cells detected by synchrotron micro-beam X-ray fluorescence analysis. Journal of Analytical Atomic Spectrometry, 27 (11). 1875pp. doi:10.1039/c2ja30188a | ||
| In | (2012) Journal of Analytical Atomic Spectrometry Vol. 27 (11) Royal Society of Chemistry (RSC) | ||
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