| Reference Type | Journal (article/letter/editorial) |
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| Title | In-depth multi-technique characterization of chromium–silicon mixed oxides produced by reactive ion beam mixing of the Cr/Si interface |
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| Journal | Journal of Analytical Atomic Spectrometry |
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| Authors | Escobar Galindo, R. | Author |
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| Benito, N. | Author |
| Duday, D. | Author |
| Fuentes, G. G. | Author |
| Valle, N. | Author |
| Herrero, P. | Author |
| Vergara, L. | Author |
| Joco, V. | Author |
| Sanchez, O. | Author |
| Arranz, A. | Author |
| Palacio, C. | Author |
| Year | 2012 | Volume | 27 |
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| Issue | 3 |
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| Publisher | Royal Society of Chemistry (RSC) |
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| DOI | doi:10.1039/c2ja10296jSearch in ResearchGate |
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| Generate Citation Formats |
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| Mindat Ref. ID | 5341733 | Long-form Identifier | mindat:1:5:5341733:4 |
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|
| GUID | 0 |
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| Full Reference | Escobar Galindo, R., Benito, N., Duday, D., Fuentes, G. G., Valle, N., Herrero, P., Vergara, L., Joco, V., Sanchez, O., Arranz, A., Palacio, C. (2012) In-depth multi-technique characterization of chromium–silicon mixed oxides produced by reactive ion beam mixing of the Cr/Si interface. Journal of Analytical Atomic Spectrometry, 27 (3). 390pp. doi:10.1039/c2ja10296j |
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| Plain Text | Escobar Galindo, R., Benito, N., Duday, D., Fuentes, G. G., Valle, N., Herrero, P., Vergara, L., Joco, V., Sanchez, O., Arranz, A., Palacio, C. (2012) In-depth multi-technique characterization of chromium–silicon mixed oxides produced by reactive ion beam mixing of the Cr/Si interface. Journal of Analytical Atomic Spectrometry, 27 (3). 390pp. doi:10.1039/c2ja10296j |
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| In | (2012) Journal of Analytical Atomic Spectrometry Vol. 27 (3) Royal Society of Chemistry (RSC) |
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