In, Jung-Hwan, Kim, Chan-Kyu, Jeong, Sungho (2015) Analysis of relative standard deviation of spectral line intensity and intensity ratio in laser-induced breakdown spectroscopy using CuIn1−xGaxSe2 thin film samples. Journal of Analytical Atomic Spectrometry, 30 (10). 2107-2119 doi:10.1039/c5ja00139k
Reference Type | Journal (article/letter/editorial) | ||
---|---|---|---|
Title | Analysis of relative standard deviation of spectral line intensity and intensity ratio in laser-induced breakdown spectroscopy using CuIn1−xGaxSe2 thin film samples | ||
Journal | Journal of Analytical Atomic Spectrometry | ||
Authors | In, Jung-Hwan | Author | |
Kim, Chan-Kyu | Author | ||
Jeong, Sungho | Author | ||
Year | 2015 | Volume | 30 |
Issue | 10 | ||
Publisher | Royal Society of Chemistry (RSC) | ||
DOI | doi:10.1039/c5ja00139kSearch in ResearchGate | ||
Generate Citation Formats | |||
Mindat Ref. ID | 5342816 | Long-form Identifier | mindat:1:5:5342816:3 |
GUID | 0 | ||
Full Reference | In, Jung-Hwan, Kim, Chan-Kyu, Jeong, Sungho (2015) Analysis of relative standard deviation of spectral line intensity and intensity ratio in laser-induced breakdown spectroscopy using CuIn1−xGaxSe2 thin film samples. Journal of Analytical Atomic Spectrometry, 30 (10). 2107-2119 doi:10.1039/c5ja00139k | ||
Plain Text | In, Jung-Hwan, Kim, Chan-Kyu, Jeong, Sungho (2015) Analysis of relative standard deviation of spectral line intensity and intensity ratio in laser-induced breakdown spectroscopy using CuIn1−xGaxSe2 thin film samples. Journal of Analytical Atomic Spectrometry, 30 (10). 2107-2119 doi:10.1039/c5ja00139k | ||
In | (2015) Journal of Analytical Atomic Spectrometry Vol. 30 (10) Royal Society of Chemistry (RSC) |
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