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In, Jung-Hwan, Kim, Chan-Kyu, Jeong, Sungho (2015) Analysis of relative standard deviation of spectral line intensity and intensity ratio in laser-induced breakdown spectroscopy using CuIn1−xGaxSe2 thin film samples. Journal of Analytical Atomic Spectrometry, 30 (10). 2107-2119 doi:10.1039/c5ja00139k

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Reference TypeJournal (article/letter/editorial)
TitleAnalysis of relative standard deviation of spectral line intensity and intensity ratio in laser-induced breakdown spectroscopy using CuIn1−xGaxSe2 thin film samples
JournalJournal of Analytical Atomic Spectrometry
AuthorsIn, Jung-HwanAuthor
Kim, Chan-KyuAuthor
Jeong, SunghoAuthor
Year2015Volume30
Issue10
PublisherRoyal Society of Chemistry (RSC)
DOIdoi:10.1039/c5ja00139kSearch in ResearchGate
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Mindat Ref. ID5342816Long-form Identifiermindat:1:5:5342816:3
GUID0
Full ReferenceIn, Jung-Hwan, Kim, Chan-Kyu, Jeong, Sungho (2015) Analysis of relative standard deviation of spectral line intensity and intensity ratio in laser-induced breakdown spectroscopy using CuIn1−xGaxSe2 thin film samples. Journal of Analytical Atomic Spectrometry, 30 (10). 2107-2119 doi:10.1039/c5ja00139k
Plain TextIn, Jung-Hwan, Kim, Chan-Kyu, Jeong, Sungho (2015) Analysis of relative standard deviation of spectral line intensity and intensity ratio in laser-induced breakdown spectroscopy using CuIn1−xGaxSe2 thin film samples. Journal of Analytical Atomic Spectrometry, 30 (10). 2107-2119 doi:10.1039/c5ja00139k
In(2015) Journal of Analytical Atomic Spectrometry Vol. 30 (10) Royal Society of Chemistry (RSC)


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