Hao, Jia-Long, Yang, Wei, Luo, Yan, Hu, Sen, Yin, Qing-Zhu, Lin, Yang-Ting (2016) NanoSIMS measurements of trace elements at the micron scale interface between zircon and silicate glass. Journal of Analytical Atomic Spectrometry, 31 (12). 2399-2409 doi:10.1039/c6ja00279j
Reference Type | Journal (article/letter/editorial) | ||
---|---|---|---|
Title | NanoSIMS measurements of trace elements at the micron scale interface between zircon and silicate glass | ||
Journal | Journal of Analytical Atomic Spectrometry | ||
Authors | Hao, Jia-Long | Author | |
Yang, Wei | Author | ||
Luo, Yan | Author | ||
Hu, Sen | Author | ||
Yin, Qing-Zhu | Author | ||
Lin, Yang-Ting | Author | ||
Year | 2016 | Volume | 31 |
Issue | 12 | ||
Publisher | Royal Society of Chemistry (RSC) | ||
DOI | doi:10.1039/c6ja00279jSearch in ResearchGate | ||
Generate Citation Formats | |||
Mindat Ref. ID | 5343539 | Long-form Identifier | mindat:1:5:5343539:4 |
GUID | 0 | ||
Full Reference | Hao, Jia-Long, Yang, Wei, Luo, Yan, Hu, Sen, Yin, Qing-Zhu, Lin, Yang-Ting (2016) NanoSIMS measurements of trace elements at the micron scale interface between zircon and silicate glass. Journal of Analytical Atomic Spectrometry, 31 (12). 2399-2409 doi:10.1039/c6ja00279j | ||
Plain Text | Hao, Jia-Long, Yang, Wei, Luo, Yan, Hu, Sen, Yin, Qing-Zhu, Lin, Yang-Ting (2016) NanoSIMS measurements of trace elements at the micron scale interface between zircon and silicate glass. Journal of Analytical Atomic Spectrometry, 31 (12). 2399-2409 doi:10.1039/c6ja00279j | ||
In | (2016) Journal of Analytical Atomic Spectrometry Vol. 31 (12) Royal Society of Chemistry (RSC) |
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