Senko, Michael W., Hendrickson, Christopher L., Emmett, Mark R., Shi, Stone D. H., Marshall, Alan G. (1997) External accumulation of ions for enhanced electrospray ionization fourier transform ion cyclotron resonance mass spectrometry. Journal of the American Society for Mass Spectrometry, 8 (9). 970-976 doi:10.1016/s1044-0305(97)00126-8
Reference Type | Journal (article/letter/editorial) | ||
---|---|---|---|
Title | External accumulation of ions for enhanced electrospray ionization fourier transform ion cyclotron resonance mass spectrometry | ||
Journal | Journal of the American Society for Mass Spectrometry | ||
Authors | Senko, Michael W. | Author | |
Hendrickson, Christopher L. | Author | ||
Emmett, Mark R. | Author | ||
Shi, Stone D. H. | Author | ||
Marshall, Alan G. | Author | ||
Year | 1997 (September) | Volume | 8 |
Issue | 9 | ||
Publisher | American Chemical Society (ACS) | ||
DOI | doi:10.1016/s1044-0305(97)00126-8Search in ResearchGate | ||
Generate Citation Formats | |||
Mindat Ref. ID | 5348178 | Long-form Identifier | mindat:1:5:5348178:2 |
GUID | 0 | ||
Full Reference | Senko, Michael W., Hendrickson, Christopher L., Emmett, Mark R., Shi, Stone D. H., Marshall, Alan G. (1997) External accumulation of ions for enhanced electrospray ionization fourier transform ion cyclotron resonance mass spectrometry. Journal of the American Society for Mass Spectrometry, 8 (9). 970-976 doi:10.1016/s1044-0305(97)00126-8 | ||
Plain Text | Senko, Michael W., Hendrickson, Christopher L., Emmett, Mark R., Shi, Stone D. H., Marshall, Alan G. (1997) External accumulation of ions for enhanced electrospray ionization fourier transform ion cyclotron resonance mass spectrometry. Journal of the American Society for Mass Spectrometry, 8 (9). 970-976 doi:10.1016/s1044-0305(97)00126-8 | ||
In | (1997, September) Journal of the American Society for Mass Spectrometry Vol. 8 (9) American Chemical Society (ACS) |
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