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MacDowell, A.A., Celestre, R.S., Tamura, N., Spolenak, R., Valek, B., Brown, W.L., Bravman, J.C., Padmore, H.A., Batterman, B.W., Patel, J.R. (2001) Submicron X-ray diffraction. Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment, 467. 936-943 doi:10.1016/s0168-9002(01)00530-7

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Reference TypeJournal (article/letter/editorial)
TitleSubmicron X-ray diffraction
JournalNuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment
AuthorsMacDowell, A.A.Author
Celestre, R.S.Author
Tamura, N.Author
Spolenak, R.Author
Valek, B.Author
Brown, W.L.Author
Bravman, J.C.Author
Padmore, H.A.Author
Batterman, B.W.Author
Patel, J.R.Author
Year2001 (July)Volume467
PublisherElsevier BV
DOIdoi:10.1016/s0168-9002(01)00530-7Search in ResearchGate
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Mindat Ref. ID5488692Long-form Identifiermindat:1:5:5488692:0
GUID0
Full ReferenceMacDowell, A.A., Celestre, R.S., Tamura, N., Spolenak, R., Valek, B., Brown, W.L., Bravman, J.C., Padmore, H.A., Batterman, B.W., Patel, J.R. (2001) Submicron X-ray diffraction. Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment, 467. 936-943 doi:10.1016/s0168-9002(01)00530-7
Plain TextMacDowell, A.A., Celestre, R.S., Tamura, N., Spolenak, R., Valek, B., Brown, W.L., Bravman, J.C., Padmore, H.A., Batterman, B.W., Patel, J.R. (2001) Submicron X-ray diffraction. Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment, 467. 936-943 doi:10.1016/s0168-9002(01)00530-7
In(2001) Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment Vol. 467. Elsevier BV

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Tamura, N., MacDowell, A. A., Celestre, R. S., Padmore, H. A., Valek, B., Bravman, J. C., Spolenak, R., Brown, W. L., Marieb, T., Fujimoto, H., Batterman, B. W., Patel, J. R. (2002) High spatial resolution grain orientation and strain mapping in thin films using polychromatic submicron x-ray diffraction. Applied Physics Letters, 80 (20). 3724-3726 doi:10.1063/1.1477621
Valek, B. C., Bravman, J. C., Tamura, N., MacDowell, A. A., Celestre, R. S., Padmore, H. A., Spolenak, R., Brown, W. L., Batterman, B. W., Patel, J. R. (2002) Electromigration-induced plastic deformation in passivated metal lines. Applied Physics Letters, 81 (22). 4168-4170 doi:10.1063/1.1525880
(2001) Committees. Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment, 467. doi:10.1016/s0168-9002(01)00688-x
Spolenak, R., Brown, W. L., Tamura, N., MacDowell, A. A., Celestre, R. S., Padmore, H. A., Valek, B., Bravman, J. C., Marieb, T., Fujimoto, H., Batterman, B. W., Patel, J. R. (2003) Local Plasticity of Al Thin Films as Revealed by X-Ray Microdiffraction. Physical Review Letters, 90 (9). doi:10.1103/physrevlett.90.096102
Tamura, N., MacDowell, A. A., Spolenak, R., Valek, B. C., Bravman, J. C., Brown, W. L., Celestre, R. S., Padmore, H. A, Batterman, B. W., Patel, J. R. (2003) Scanning X-ray microdiffraction with submicrometer white beam for strain/stress and orientation mapping in thin films. Journal of Synchrotron Radiation, 10 (2). 137-143 doi:10.1107/s0909049502021362
(2001) Contents. Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment, 467. doi:10.1016/s0168-9002(01)01342-0
Spolenak, R., Tamura, N., Valek, B., Brown, W. L., MacDowell, A. A., Celestre, R. C., Padmore, H. A., Bravman, J. C., Batterman, B. W., Patel, J. R. (2002) Uniaxial plastic deformation of polycrystalline Cu and Al thin films studied on a grain by grain basis utilizing X-ray microdiffraction. Acta Crystallographica Section A Foundations of Crystallography, 58. doi:10.1107/s0108767302086452
Adams, B. (2001) Proposal for a femtosecond X-ray detector. Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment, 467. 1129-1131 doi:10.1016/s0168-9002(01)00612-x
Tamura, N., Celestre, R. S., MacDowell, A. A., Padmore, H. A., Spolenak, R., Valek, B. C., Meier Chang, N., Manceau, A., Patel, J. R. (2002) Submicron x-ray diffraction and its applications to problems in materials and environmental science. Review of Scientific Instruments, 73 (3). 1369-1372 doi:10.1063/1.1436539
(2001) Conference photo's. Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment, 467. doi:10.1016/s0168-9002(01)00689-1
(2001) Short Contents. Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment, 467. doi:10.1016/s0168-9002(01)01343-2
 
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