Herbots, Nicole, Lobet, Maurice, Van de Wiele, Fernand (1985) RBS study of the effect of arsenic and phosphorus interfacial segregation upon the sintering of contacts between implanted polycrystalline silicon and aluminum: Silicon(1%). Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 7. 278-286 doi:10.1016/0168-583x(85)90566-x
Reference Type | Journal (article/letter/editorial) | ||
---|---|---|---|
Title | RBS study of the effect of arsenic and phosphorus interfacial segregation upon the sintering of contacts between implanted polycrystalline silicon and aluminum: Silicon(1%) | ||
Journal | Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms | ||
Authors | Herbots, Nicole | Author | |
Lobet, Maurice | Author | ||
Van de Wiele, Fernand | Author | ||
Year | 1985 (March) | Volume | 7 |
Publisher | Elsevier BV | ||
DOI | doi:10.1016/0168-583x(85)90566-xSearch in ResearchGate | ||
Generate Citation Formats | |||
Mindat Ref. ID | 5584022 | Long-form Identifier | mindat:1:5:5584022:6 |
GUID | 0 | ||
Full Reference | Herbots, Nicole, Lobet, Maurice, Van de Wiele, Fernand (1985) RBS study of the effect of arsenic and phosphorus interfacial segregation upon the sintering of contacts between implanted polycrystalline silicon and aluminum: Silicon(1%). Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 7. 278-286 doi:10.1016/0168-583x(85)90566-x | ||
Plain Text | Herbots, Nicole, Lobet, Maurice, Van de Wiele, Fernand (1985) RBS study of the effect of arsenic and phosphorus interfacial segregation upon the sintering of contacts between implanted polycrystalline silicon and aluminum: Silicon(1%). Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 7. 278-286 doi:10.1016/0168-583x(85)90566-x | ||
In | (1985) Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms Vol. 7. Elsevier BV |
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