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Šmit, Ž. (1987) Surface roughness correction in thick target pixe analysis. Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 28 (4). 567-570 doi:10.1016/0168-583x(87)90504-0

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Reference TypeJournal (article/letter/editorial)
TitleSurface roughness correction in thick target pixe analysis
JournalNuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms
AuthorsŠmit, Ž.Author
Year1987 (November)Volume28
Issue4
PublisherElsevier BV
DOIdoi:10.1016/0168-583x(87)90504-0Search in ResearchGate
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Mindat Ref. ID5589917Long-form Identifiermindat:1:5:5589917:0
GUID0
Full ReferenceŠmit, Ž. (1987) Surface roughness correction in thick target pixe analysis. Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 28 (4). 567-570 doi:10.1016/0168-583x(87)90504-0
Plain TextŠmit, Ž. (1987) Surface roughness correction in thick target pixe analysis. Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 28 (4). 567-570 doi:10.1016/0168-583x(87)90504-0
In(1987, November) Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms Vol. 28 (4) Elsevier BV

See Also

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Šmit, Ž. (1986) The analysis of the power approximation in thick target PIXE analysis. Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 17 (2). 156-161 doi:10.1016/0168-583x(86)90078-9
Budnar, M., Šmit, Ž., Kump, P. (1990) Thick target yields for determination of thin target pixe efficiency. Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 49 (1). 138-140 doi:10.1016/0168-583x(90)90230-r
Clayton, E. (1987) PIXE analysis of thick target biological samples in vacuum. Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 22 (1). 145-148 doi:10.1016/0168-583x(87)90312-0
Šmit, Ž., Budnar, M., Cindro, V., Ramšak, V., Ravnikar, M. (1984) The analysis of thick target metal alloys. Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 4 (1). 114-119 doi:10.1016/0168-583x(84)90050-8
Cohen, David D., Clayton, E. (1987) A database for thick target PIXE. Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 22 (1). 59-63 doi:10.1016/0168-583x(87)90294-1
Niiler, Andrus (1987) Stopping power uncertainty effects in thick target rbs analysis. Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 24. 358-361 doi:10.1016/0168-583x(87)90660-4
Šmit, Ž. (2020) Physics beyond PIXE. Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 477. 13-18 doi:10.1016/j.nimb.2019.09.019
Rickards, J., Zironi, E.P. (1987) Multilayer pixe analysis. Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 29 (3). 527-530 doi:10.1016/0168-583x(87)90064-4
(1987) Calendar. Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 28 (4). 592-594 doi:10.1016/0168-583x(87)90509-x
The Florida PIXE Committee, (1987) Editorial. Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 22 (1). doi:10.1016/0168-583x(87)90281-3
Šmit, Ž. (2005) Recent developments of material analysis with PIXE. Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 240 (1). 258-264 doi:10.1016/j.nimb.2005.06.126
 
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