Hasegawa, M., Kimura, K., Fujii, Y., Suzuki, M., Susuki, Y., Mannami, M. (1988) Secondary electron emission due to MeV He ions at glancing incidence angles on clean single crystal surfaces. Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 33 (1). 334-337 doi:10.1016/0168-583x(88)90578-2
Reference Type | Journal (article/letter/editorial) | ||
---|---|---|---|
Title | Secondary electron emission due to MeV He ions at glancing incidence angles on clean single crystal surfaces | ||
Journal | Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms | ||
Authors | Hasegawa, M. | Author | |
Kimura, K. | Author | ||
Fujii, Y. | Author | ||
Suzuki, M. | Author | ||
Susuki, Y. | Author | ||
Mannami, M. | Author | ||
Year | 1988 (June) | Volume | 33 |
Issue | 1 | ||
Publisher | Elsevier BV | ||
DOI | doi:10.1016/0168-583x(88)90578-2Search in ResearchGate | ||
Generate Citation Formats | |||
Mindat Ref. ID | 5591022 | Long-form Identifier | mindat:1:5:5591022:4 |
GUID | 0 | ||
Full Reference | Hasegawa, M., Kimura, K., Fujii, Y., Suzuki, M., Susuki, Y., Mannami, M. (1988) Secondary electron emission due to MeV He ions at glancing incidence angles on clean single crystal surfaces. Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 33 (1). 334-337 doi:10.1016/0168-583x(88)90578-2 | ||
Plain Text | Hasegawa, M., Kimura, K., Fujii, Y., Suzuki, M., Susuki, Y., Mannami, M. (1988) Secondary electron emission due to MeV He ions at glancing incidence angles on clean single crystal surfaces. Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 33 (1). 334-337 doi:10.1016/0168-583x(88)90578-2 | ||
In | (1988, June) Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms Vol. 33 (1) Elsevier BV |
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