Reference Type | Journal (article/letter/editorial) |
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Title | Gate-edge effects on SPE regrowth from As+-implanted Si |
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Journal | Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms |
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Authors | Horiuchi, M. | Author |
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Tamura, M. | Author |
Aoki, S. | Author |
Year | 1989 (February) | Volume | 37 |
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Publisher | Elsevier BV |
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DOI | doi:10.1016/0168-583x(89)90187-0Search in ResearchGate |
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| Generate Citation Formats |
Mindat Ref. ID | 5592010 | Long-form Identifier | mindat:1:5:5592010:6 |
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GUID | 0 |
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Full Reference | Horiuchi, M., Tamura, M., Aoki, S. (1989) Gate-edge effects on SPE regrowth from As+-implanted Si. Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 37. 285-289 doi:10.1016/0168-583x(89)90187-0 |
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Plain Text | Horiuchi, M., Tamura, M., Aoki, S. (1989) Gate-edge effects on SPE regrowth from As+-implanted Si. Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 37. 285-289 doi:10.1016/0168-583x(89)90187-0 |
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In | (1989) Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms Vol. 37. Elsevier BV |
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