Anjum, M., Sandhu, G.S., Cherekdjian, S., Weisenberger, W. (1991) Thermal wave characterization of silicon implanted with MeV phosphorus ions. Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 55 (1). 266-268 doi:10.1016/0168-583x(91)96175-k
Reference Type | Journal (article/letter/editorial) | ||
---|---|---|---|
Title | Thermal wave characterization of silicon implanted with MeV phosphorus ions | ||
Journal | Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms | ||
Authors | Anjum, M. | Author | |
Sandhu, G.S. | Author | ||
Cherekdjian, S. | Author | ||
Weisenberger, W. | Author | ||
Year | 1991 (April) | Volume | 55 |
Issue | 1 | ||
Publisher | Elsevier BV | ||
DOI | doi:10.1016/0168-583x(91)96175-kSearch in ResearchGate | ||
Generate Citation Formats | |||
Mindat Ref. ID | 5596317 | Long-form Identifier | mindat:1:5:5596317:4 |
GUID | 0 | ||
Full Reference | Anjum, M., Sandhu, G.S., Cherekdjian, S., Weisenberger, W. (1991) Thermal wave characterization of silicon implanted with MeV phosphorus ions. Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 55 (1). 266-268 doi:10.1016/0168-583x(91)96175-k | ||
Plain Text | Anjum, M., Sandhu, G.S., Cherekdjian, S., Weisenberger, W. (1991) Thermal wave characterization of silicon implanted with MeV phosphorus ions. Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 55 (1). 266-268 doi:10.1016/0168-583x(91)96175-k | ||
In | (1991, April) Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms Vol. 55 (1) Elsevier BV |
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