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Nakao, A., Iwaki, M., Sakairi, H., Terasima, K. (1992) XPS characterization of nitrogen implanted silicon carbide. Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 65 (1). 352-356 doi:10.1016/0168-583x(92)95065-y

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Reference TypeJournal (article/letter/editorial)
TitleXPS characterization of nitrogen implanted silicon carbide
JournalNuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms
AuthorsNakao, A.Author
Iwaki, M.Author
Sakairi, H.Author
Terasima, K.Author
Year1992 (March)Volume65
Issue1
PublisherElsevier BV
DOIdoi:10.1016/0168-583x(92)95065-ySearch in ResearchGate
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Mindat Ref. ID5599183Long-form Identifiermindat:1:5:5599183:0
GUID0
Full ReferenceNakao, A., Iwaki, M., Sakairi, H., Terasima, K. (1992) XPS characterization of nitrogen implanted silicon carbide. Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 65 (1). 352-356 doi:10.1016/0168-583x(92)95065-y
Plain TextNakao, A., Iwaki, M., Sakairi, H., Terasima, K. (1992) XPS characterization of nitrogen implanted silicon carbide. Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 65 (1). 352-356 doi:10.1016/0168-583x(92)95065-y
In(1992, March) Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms Vol. 65 (1) Elsevier BV

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Suzuki, Y., Kusakabe, M., Lee, J.-S., Kaibara, M., Iwaki, M., Sasabe, H. (1992) Endothelial cell adhesion to ion implanted polymers. Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 65 (1). 142-147 doi:10.1016/0168-583x(92)95027-o
Föhl, A., Emrick, R.M., Carstanjen, H.D. (1992) A Rutherford backscattering study of Ar- and Xe-implanted silicon carbide. Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 65 (1). 335-340 doi:10.1016/0168-583x(92)95062-v
Hideo Hosono, (1992) Structural defects and the state of implanted ions in silica glasses implanted with silicon and/or nitrogen ions. Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 65 (1). 375-379 doi:10.1016/0168-583x(92)95069-4
(1992) Conferance photograph. Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 65 (1). doi:10.1016/0168-583x(92)95003-a
(1992) Photograph key. Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 65 (1). doi:10.1016/0168-583x(92)95004-b
Galeckas, A., Petrauskas, M., Wahab, Q., Willander, M. (1992) Nonlinear optical investigation of silicon carbide surface properties. Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 65 (1). 357-360 doi:10.1016/0168-583x(92)95066-z
(1992) Editorial Board. Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 65 (1). doi:10.1016/0168-583x(92)95001-8
(1992) International committee. Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 65 (1). doi:10.1016/0168-583x(92)95005-c
Townsend, P.D. (1992) Ion implanted waveguides and waveguide lasers. Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 65 (1). 243-250 doi:10.1016/0168-583x(92)95042-p
(1992) Preface. Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 66 (1). doi:10.1016/0168-583x(92)96131-h
(1992) Editorial Board. Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 64 (1). doi:10.1016/0168-583x(92)95430-y
 
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