Shukla, Neeraj, Tripathi, Sarvesh K., Sarkar, Mihir, Rajput, Nitul S., Kulkarni, Vishwas N. (2009) Micro and nano patterning by focused ion beam enhanced adhesion. Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 267 (8). 1376-1380 doi:10.1016/j.nimb.2009.01.048
Reference Type | Journal (article/letter/editorial) | ||
---|---|---|---|
Title | Micro and nano patterning by focused ion beam enhanced adhesion | ||
Journal | Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms | ||
Authors | Shukla, Neeraj | Author | |
Tripathi, Sarvesh K. | Author | ||
Sarkar, Mihir | Author | ||
Rajput, Nitul S. | Author | ||
Kulkarni, Vishwas N. | Author | ||
Year | 2009 (May) | Volume | 267 |
Issue | 8 | ||
Publisher | Elsevier BV | ||
DOI | doi:10.1016/j.nimb.2009.01.048Search in ResearchGate | ||
Generate Citation Formats | |||
Mindat Ref. ID | 5642124 | Long-form Identifier | mindat:1:5:5642124:0 |
GUID | 0 | ||
Full Reference | Shukla, Neeraj, Tripathi, Sarvesh K., Sarkar, Mihir, Rajput, Nitul S., Kulkarni, Vishwas N. (2009) Micro and nano patterning by focused ion beam enhanced adhesion. Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 267 (8). 1376-1380 doi:10.1016/j.nimb.2009.01.048 | ||
Plain Text | Shukla, Neeraj, Tripathi, Sarvesh K., Sarkar, Mihir, Rajput, Nitul S., Kulkarni, Vishwas N. (2009) Micro and nano patterning by focused ion beam enhanced adhesion. Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 267 (8). 1376-1380 doi:10.1016/j.nimb.2009.01.048 | ||
In | (2009, May) Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms Vol. 267 (8) Elsevier BV |
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