Kamioka, K., Oga, T., Izawa, Y., Kuriyama, K., Kushida, K. (2013) Characterization of the lattice defects in Ge-ion implanted ZnO bulk single crystals by Rutherford Backscattering: Origins of low resistivity. Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 307. 366-369 doi:10.1016/j.nimb.2012.11.057
Reference Type | Journal (article/letter/editorial) | ||
---|---|---|---|
Title | Characterization of the lattice defects in Ge-ion implanted ZnO bulk single crystals by Rutherford Backscattering: Origins of low resistivity | ||
Journal | Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms | ||
Authors | Kamioka, K. | Author | |
Oga, T. | Author | ||
Izawa, Y. | Author | ||
Kuriyama, K. | Author | ||
Kushida, K. | Author | ||
Year | 2013 (July) | Volume | 307 |
Publisher | Elsevier BV | ||
DOI | doi:10.1016/j.nimb.2012.11.057Search in ResearchGate | ||
Generate Citation Formats | |||
Mindat Ref. ID | 5647683 | Long-form Identifier | mindat:1:5:5647683:3 |
GUID | 0 | ||
Full Reference | Kamioka, K., Oga, T., Izawa, Y., Kuriyama, K., Kushida, K. (2013) Characterization of the lattice defects in Ge-ion implanted ZnO bulk single crystals by Rutherford Backscattering: Origins of low resistivity. Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 307. 366-369 doi:10.1016/j.nimb.2012.11.057 | ||
Plain Text | Kamioka, K., Oga, T., Izawa, Y., Kuriyama, K., Kushida, K. (2013) Characterization of the lattice defects in Ge-ion implanted ZnO bulk single crystals by Rutherford Backscattering: Origins of low resistivity. Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 307. 366-369 doi:10.1016/j.nimb.2012.11.057 | ||
In | (2013) Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms Vol. 307. Elsevier BV |
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