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Alarcon-Diez, V., Eddrief, M., Vickridge, I. (2016) Rutherford Backscattering Spectrometry analysis of iron-containing Bi 2 Se 3 topological insulator thin films. Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 371. 224-229 doi:10.1016/j.nimb.2015.11.031

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Reference TypeJournal (article/letter/editorial)
TitleRutherford Backscattering Spectrometry analysis of iron-containing Bi 2 Se 3 topological insulator thin films
JournalNuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms
AuthorsAlarcon-Diez, V.Author
Eddrief, M.Author
Vickridge, I.Author
Year2016 (March)Volume371
PublisherElsevier BV
DOIdoi:10.1016/j.nimb.2015.11.031Search in ResearchGate
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Mindat Ref. ID5652844Long-form Identifiermindat:1:5:5652844:6
GUID0
Full ReferenceAlarcon-Diez, V., Eddrief, M., Vickridge, I. (2016) Rutherford Backscattering Spectrometry analysis of iron-containing Bi 2 Se 3 topological insulator thin films. Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 371. 224-229 doi:10.1016/j.nimb.2015.11.031
Plain TextAlarcon-Diez, V., Eddrief, M., Vickridge, I. (2016) Rutherford Backscattering Spectrometry analysis of iron-containing Bi 2 Se 3 topological insulator thin films. Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 371. 224-229 doi:10.1016/j.nimb.2015.11.031
In(2016) Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms Vol. 371. Elsevier BV

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